Extraction of the Random Component of Time-Dependent Variability Using Matched Pairs

被引：17

作者：

Kaczer, Ben ^{[1
]}

Franco, Jacopo ^{[1
]}

Roussel, Philippe J. ^{[1
]}

Groeseneken, Guido ^{[1
,2
]}

Chiarella, Thomas ^{[1
]}

Horiguchi, Naoto ^{[1
]}

Grasser, Tibor ^{[3
]}

机构：

[1] IMEC, B-3001 Leuven, Belgium

[2] Katholieke Univ Leuven, Dept Elect Engn, B-3000 Leuven, Belgium

[3] Vienna Univ Technol, A-1040 Vienna, Austria

来源：

IEEE ELECTRON DEVICE LETTERS | 2015年 / 36卷 / 04期

关键词：

Variability; reliability; FinFETs; matched pairs;

D O I：

10.1109/LED.2015.2404293

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Based on the so-called defect-centric statistics, we propose the average impact of a single charged trap on FET threshold voltage as a physically based measure of the random component of time-dependent variability. We show that it can be extracted using matched pairs, analogously to time-zero variability. To that end, the defect-centric statistics of matched pairs are discussed and the correlation between time-zero and time-dependent variances is formalized.

引用

收藏

页码：300 / 302

页数：3

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