Swept-wavelength interferometric analysis of multiport components

被引：36

作者：

VanWiggeren, GD ^{[1
]}

Baney, DM ^{[1
]}

机构：

[1] Agilent Labs, Palo Alto, CA 94304 USA

来源：

IEEE PHOTONICS TECHNOLOGY LETTERS | 2003年 / 15卷 / 09期

关键词：

optical devices; optical interferometry; optical variables measurement; reflectometry;

D O I：

10.1109/LPT.2003.816663

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

We demonstrate a novel technique for characterization of multiport devices. Using this technique, we simultaneously characterize all four ports of an arrayed waveguide grating. The technique is described and experimental results are presented, including measurements of group delay, differential group delay, insertion loss, and polarization-dependent loss.

引用

页码：1267 / 1269

页数：3

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