Effects of Laser Selective Reflow on Solder Joint Microstructure and Reliability

被引:12
作者
Wentlent, Luke A. [1 ]
Genanu, Mohammed [2 ]
Alghoul, Thaer [3 ]
机构
[1] Univ Instruments Corp, Adv Proc Lab, Conklin, NY 13748 USA
[2] SUNY Binghamton, Phys & Mat Sci, Binghamton, NY USA
[3] SUNY Binghamton, Syst Sci & Ind Engn, Binghamton, NY USA
来源
2018 IEEE 68TH ELECTRONIC COMPONENTS AND TECHNOLOGY CONFERENCE (ECTC 2018) | 2018年
关键词
Pb-free; Microstructure; Laser Reflow; Fatigue; Creep; BEHAVIOR; AG;
D O I
10.1109/ECTC.2018.00070
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
New applications and materials continue to pose challenges and opportunities for automated microelectronics manufacturing. Alternative approaches are becoming available but for most purposes the use of soldering in high volume applications still offer major advantages. However, the inability of many inexpensive materials to survive conventional mass reflow temperatures present a serious obstacle to this. One potential work-around still offering a relatively high throughput would be the use of selective laser reflow. This allows the local heating of solder joints and paste deposits for such a short time that other parts of the assembly are not heated nearly as much. Of course the properties of the resulting solder joints are somewhat different than typically achieved with mass reflow. An example of the use of a commercial infrared (IR) laser reflow instrument and its consequences in terms of solder joint properties was considered. Details including the impact of material properties and sample geometry on thermal profiles will be described for a representative example. The unique solder microstructures achieved because of the high heating and cooling rates were characterized, and associated properties such as creep rates and fatigue life quantified. Results are discussed in terms of consequences for life under realistic long term service conditions.
引用
收藏
页码:425 / 433
页数:9
相关论文
共 50 条
  • [21] Influence of Argon Reflow on the Microstructure and Properties of Lead-free Solder Joints
    Tao, Yeqing
    Guo, Jason
    Ding, Dongyan
    Li, Ting
    Yu, Yunhong
    2015 16TH INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY, 2015,
  • [22] Fatigue Properties and Microstructure of SnAgCu Bi-Based Solder Joint
    Jian, Minghong
    Su, Sinan
    Hamasha, Sa'd
    Hamasha, Mohammad M.
    Alkhazali, Atif
    JOURNAL OF ELECTRONIC PACKAGING, 2021, 143 (01)
  • [23] Reliability of SnPbSb/Cu Solder Joint in the High-Temperature Application
    Xu, Jiachen
    Fu, Yucan
    Zhou, Xiaoxiao
    Zhang, Junqian
    Xue, Songbai
    CRYSTALS, 2022, 12 (12)
  • [24] Effects of mechanical vibration on microstructure of laser welded joint
    Peng, Birong
    Lu, Qinghua
    He, Xiaofeng
    Guo, Chong
    Jixie Gongcheng Xuebao/Journal of Mechanical Engineering, 2015, 51 (20): : 94 - 100
  • [25] Effects of Creep Failure Mechanisms on Thermomechanical Reliability of Solder Joints in Power Semiconductors
    Samavatian, Vahid
    Iman-Eini, Hossein
    Avenas, Yvan
    Samavatian, Majid
    IEEE TRANSACTIONS ON POWER ELECTRONICS, 2020, 35 (09) : 8956 - 8964
  • [26] Effects of Mechanical Cycling on the Microstructure of SAC305 Lead Free Solder
    Chowdhury, Md Mahmudur
    Hoque, Mohd Aminul
    Ahmed, Sudan
    Suhling, Jeffrey C.
    Hamasha, Sa'd
    Lall, Pradeep
    PROCEEDINGS OF THE 17TH IEEE INTERSOCIETY CONFERENCE ON THERMAL AND THERMOMECHANICAL PHENOMENA IN ELECTRONIC SYSTEMS (ITHERM 2018), 2018, : 1324 - 1332
  • [27] SOLDER JOINT RELIABILITY OF INDIUM-ALLOY INTERCONNECTION
    SHIMIZU, K
    NAKANISHI, T
    KARASAWA, K
    HASHIMOTO, K
    NIWA, K
    JOURNAL OF ELECTRONIC MATERIALS, 1995, 24 (01) : 39 - 45
  • [28] Solder joint reliability under realistic service conditions
    Borgesen, P.
    Hamasha, S.
    Obaidat, M.
    Raghavan, V.
    Dai, X.
    Meilunas, M.
    Anselm, M.
    MICROELECTRONICS RELIABILITY, 2013, 53 (9-11) : 1587 - 1591
  • [29] Research Progress on the Solder Joint Reliability of Electronics Using in Deep Space Exploration
    Guan, Qilong
    Hang, Chunjin
    Li, Shengli
    Yu, Dan
    Ding, Ying
    Wang, Xiuli
    Tian, Yanhong
    CHINESE JOURNAL OF MECHANICAL ENGINEERING, 2023, 36 (01)
  • [30] Characterization on acceleration-factor equation for packaging-solder joint reliability
    Wu, K. -C.
    Chiang, K. -N.
    MICROELECTRONICS RELIABILITY, 2016, 65 : 167 - 172