Comment on the paper "Interferometric testing of optical surfaces: absolute measurements of flatness"

被引:14
作者
Evans, CJ [1 ]
机构
[1] Natl Inst Stand & Technol, Div Precis Engn, Gaithersburg, MD 20899 USA
关键词
D O I
10.1117/1.601704
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
引用
收藏
页码:1880 / 1882
页数:3
相关论文
共 50 条
  • [31] Absolute testing of the profiles of large-size flat optical surfaces
    Kozhevatov I.E.
    Rudenchik E.A.
    Cheragin N.P.
    Kulikova E.K.
    Radiophysics and Quantum Electronics, 2001, 44 (07) : 575 - 581
  • [32] Interferometric testing of optical parallels
    Greco, V
    Marchesini, F
    Molesini, G
    JOURNAL OF OPTICS A-PURE AND APPLIED OPTICS, 1999, 1 (06): : 741 - 745
  • [33] Absolute testing of aspheric surfaces
    Reichelt, S
    Pruss, C
    Tiziani, HJ
    OPTICAL FABRICATION, TESTING, AND METROLOGY, 2004, 5252 : 252 - 263
  • [34] Absolute sapphire optical fiber interferometric sensors
    Xiao, H
    Xie, Y
    Deng, J
    May, RG
    Wang, A
    PROCESS MONITORING WITH OPTICAL FIBERS AND HARSH ENVIRONMENT SENSORS, 1999, 3538 : 115 - 121
  • [35] Poking surfaces: Absolute, interferometric, complex spectral measurement
    Shultz, Mary
    Bisson, Patrick
    Marmolejos, Joam
    Wang, Jing
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2018, 255
  • [36] ABSOLUTE TESTING OF FLATNESS STANDARDS AT SQUARE-GRID POINTS
    GRZANNA, J
    SCHULZ, G
    OPTICS COMMUNICATIONS, 1990, 77 (2-3) : 107 - 112
  • [37] Absolute flatness measurement method based on oblique incidence testing
    Han, Zhigang
    Chen, Lei
    Gao, Bo
    Li, Jianxin
    Liu, Zhaodong
    Yi Qi Yi Biao Xue Bao/Chinese Journal of Scientific Instrument, 2011, 32 (03): : 707 - 712
  • [38] High accuracy absolute flatness testing using a commercial interferometer
    Han, S
    Novak, E
    ADVANCED OPTICAL MANUFACTURING AND TESTING TECHNOLOGY 2000, 2000, 4231 : 277 - 282
  • [39] High-accuracy interferometric measurements of flatness and parallelism of a step gauge
    Kruger, OA
    METROLOGIA, 2001, 38 (03) : 237 - 240
  • [40] FIZEAU INTERFEROMETER FOR MEASURING FLATNESS OF OPTICAL SURFACES
    BUNNAGEL, R
    OEHRING, HA
    STEINER, K
    APPLIED OPTICS, 1968, 7 (02): : 331 - &