Going Nonlinear

被引：40

作者：

Baylis, Charles ^{[1
]}

Marks, Robert J., II ^{[1
]}

Martin, Josh ^{[1
]}

Miller, Hunter ^{[1
]}

Moldovan, Matthew ^{[1
]}

机构：

[1] Baylor Univ, Dept Elect & Comp Engn, Wireless & Microwave Circuits & Syst Program, Waco, TX 76798 USA

来源：

IEEE MICROWAVE MAGAZINE | 2011年 / 12卷 / 02期

关键词：

D O I：

10.1109/MMM.2010.940102

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Since the advent of the nonlinear vector network analyzer (NVNA), microwave engineers have become familiar with new terminology regarding nonlinear network parameters such as X-parameters (registered trademark of Agilent Technologies) [1], S-functions, [2][4], and waveform engineering/the Cardiff model [5], as well as new types of equipment used to perform nonlinear characterizations [6]. These nonlinear network parameter approaches have been developed by Root and Verspecht [1], Verbeyst and Vanden Bossche [2][4], and Tasker [5]. Equipment is now commercially available to measure these parameters. © 2011 IEEE.

引用

页码：55 / 64

页数：10

共 21 条

[1] BAYLIS C, 2010, P IEEE WAV DIV C NIA, P220
[2] CHU E, 2008, DISCRETE CONTINUOUS, P314
[3] Generation of spectrally confined transmitted radar waveforms: Experimental results
de Graaf, J.
Faust, H.
Alatishe, J.
Talapatra, S.
[J]. 2006 IEEE RADAR CONFERENCE, VOLS 1 AND 2, 2006, : 76 - +
[4] Gonzalez G., 1997, MICROWAVE TRANSISTOR, V2
[5] HORN J, 2010, 2010 IEEE CSIC S MON, P39
[6] Marks RJ., 2009, Handbook of Fourier analysis its applications
[7] MYSLINSKI M, 2009, 74 ARFTG C BROOMF CO, P107
[8] MYSLINSKI M, 2009, 74 AUT RF TECHN GROU, P1
[9] Pailloncy G, 2009, MICROWAVE J, V52, P118
[10] ROOT D, 2008, MICROWAVE ENG EUR, V51, P16

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