Magnetic properties of c-axis textured Nd2Fe14B thin films

被引：21
|
作者：
Keavney, DJ
Fullerton, EE
Pearson, JE
Bader, SD
机构：
[1] Materials Science Division, Argonne National Laboratory, Argonne, IL 60439
来源：
IEEE TRANSACTIONS ON MAGNETICS | 1996年 / 32卷 / 05期
关键词：
D O I：
10.1109/20.538894
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Thin films of Nd2Fe14B (similar to 30-60 nm) were grown with c-axis texture by means of molecular beam epitaxy. A two-phase structure is observed in both the x-ray diffraction and the hysteresis loops, due to an interfacial reaction during the initial growth. Coercivities are 1-2 T at 20 K, and the anisotropy fields are bulk-like. Microstructural analysis by atomic and magnetic force microscopies reveal lateral grain sizes of similar to 200 nm, which could explain the hard magnetic properties.
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收藏
页码：4440 / 4442
页数：3
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