General iterative algorithm for phase-extraction from fringe patterns with random phase-shifts, intensity harmonics and non-uniform phase-shift distribution

被引:17
作者
Chen, Yuchi [1 ]
Qian Kemao [1 ]
机构
[1] Nanyang Technol Univ, Sch Comp Sci & Engn, Singapore 639798, Singapore
关键词
INTERFEROMETRY; ERRORS; VIBRATION; DESIGN; MODEL;
D O I
10.1364/OE.436186
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Advanced iterative algorithm (AIA) is a flexible and effective phase-shifting algorithm (PSA) which can extract phase from fringe patterns with random unknown phase-shifts, making it attractive in the scenarios where phase-shifts are unknown or not accurate. However, accuracy of AIA degrades when intensity harmonics and/or phase-shift non-uniformity are presented. To solve this problem, multiple PSAs have been proposed, but they restrict their fringe model in one way or another, and thus sacrifice the immunity to certain error source(s). In this paper, a general iterative algorithm (GIA) which adopts a most general fringe model is proposed. In GIA, the many unknowns in the fringe pattern model are divided into three groups including: (i) the fringe amplitudes, (ii) the phase and (iii) the phase-shifts related parameters, and alternatively optimized through univariate search technique group by group to improve accuracy and convergence. The Levenberg-Marquart method is used for the optimization of each group of unknowns due to its excellent accuracy and robustness. GIA is shown to have better accuracies than all of its relevant competitors through both a large number of simulations as well as real experiments with a Fizeau interferometer. (C) 2021 Optical Society of America under the terms of the OSA Open Access Publishing Agreement
引用
收藏
页码:30905 / 30926
页数:22
相关论文
共 38 条
  • [21] Kemao Q., 2013, WINDOWED FRINGE PATT, P203
  • [22] Multiple-surface interferometry of highly reflective wafer by wavelength tuning
    Kim, Yangjin
    Hibino, Kenichi
    Hanayama, Ryohei
    Sugita, Naohiko
    Mitsuishi, Mamoru
    [J]. OPTICS EXPRESS, 2014, 22 (18): : 21145 - 21156
  • [23] DESIGN AND ASSESSMENT OF SYMMETRICAL PHASE-SHIFTING ALGORITHMS
    LARKIN, KG
    OREB, BF
    [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION, 1992, 9 (10) : 1740 - 1748
  • [24] Gamma model and its analysis for phase measuring profilometry
    Liu, Kai
    Wang, Yongchang
    Lau, Daniel L.
    Hao, Qi
    Hassebrook, Laurence G.
    [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION, 2010, 27 (03) : 553 - 562
  • [25] A three-step least-squares iterative method for tilt phase-shift interferometry
    Liu, Qian
    Wang, Yang
    Ji, Fang
    He, Jianguo
    [J]. OPTICS EXPRESS, 2013, 21 (24): : 29505 - 29515
  • [26] Madsen K., 2008, INTRO OPTIMIZATION D, P115
  • [27] Malacara D., 2007, OPTICAL SHOP TESTING, V59, P547
  • [28] Pyzara A., 2011, 2011 Federated Conference on Computer Science and Information Systems (FedCSIS), P459
  • [29] Phase-stepping interferometry:: methods for reducing errors caused by camera nonlinearities
    Schödel, R
    Nicolaus, A
    Bönsch, G
    [J]. APPLIED OPTICS, 2002, 41 (01) : 55 - 63
  • [30] The general theory of phase shifting algorithms
    Servin, M.
    Estrada, J. C.
    Quiroga, J. A.
    [J]. OPTICS EXPRESS, 2009, 17 (24): : 21867 - 21881