共 3 条
Compact Modeling of the Switching Dynamics and Temperature Dependencies in TiOx-Based Memristors - Part I: Behavioral Model
被引:4
|作者:
Vaidya, Dhirendra
[1
]
Kothari, Shraddha
[1
]
Abbey, Thomas
[1
]
Stathopoulos, Spyros
[1
]
Michalas, Loukas
[1
]
Serb, Alexantrou
[1
]
Prodromakis, Themis
[1
]
机构:
[1] Univ Southampton, Ctr Elect Frontiers, Southampton SO17 1BJ, Hants, England
基金:
英国工程与自然科学研究理事会;
关键词:
Behavioral model;
metal oxide memristors;
pulsed resistance transient (PRT) measurements;
resistive RAMs switching dynamics;
temperature dependence;
TiOx memristors;
BOOLEAN LOGIC;
DEVICE;
CROSSBAR;
MEMORY;
D O I:
10.1109/TED.2021.3101996
中图分类号:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号:
0808 ;
0809 ;
摘要:
Memristor is a promising device as a fundamental building block for future unconventional system architectures such as neuromorphic computing, reconfigurable logic, and multibit memories. Therefore, to facilitate circuit design using memristors, accurate and efficient models spanning a wide range of programming voltages and temperatures are required. In the first part of this series, we propose a behavioral model for temperature dependence of nonvolatile switching dynamics of TiOx memristors. We begin by describing pulsed resistance transients (PRTs) of the memristors and then we use a multistage methodology to establish bias and temperature dependence of the model parameters. The proposed model is then shown to accurately describe the PRT characteristics of Pt/TiOx/Au and Pt/TiOx/Pt memristors.
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页码:4877 / 4884
页数:8
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