Triaxial AFM Probes for Noncontact Trapping and Manipulation

被引：23

作者：

Brown, Keith A.

Westervelt, Robert M. ^{[1
]}

机构：

[1] Harvard Univ, Sch Engn & Appl Sci, Cambridge, MA 02138 USA

来源：

NANO LETTERS | 2011年 / 11卷 / 08期

关键词：

Dielectrophoresis; noncontact trapping; AFM; assembly; nanoparticles; triaxial; ATOMIC-FORCE MICROSCOPY; ADHESION;

D O I：

10.1021/nl201434t

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

We show that a triaxial atomic force microscopy probe creates a noncontact trap for a single particle in a fluid via negative dielectrophoresis. A zero in the electric field profile traps the particle above the probe surface, avoiding adhesion, and the repulsive region surrounding the zero pushes other particles away, preventing clustering. Triaxial probes are promising for three-dimensional assembly and for selective imaging of a particular property of a sample using interchangeable functionalized particles.

引用

页码：3197 / 3201

页数：5

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