Visualization of Charge Carrier Motion in Semiconductor Nanowires with Ultrafast Pump-Probe Microscopy

被引：0

作者：

Gabriel, Michelle M. ^{[1
]}

Grumstrup, Erik M. ^{[1
]}

Kirschbrown, Justin R. ^{[1
]}

Pinion, Christopher W. ^{[1
]}

Christesen, Joseph D. ^{[1
]}

Zigler, David F. ^{[1
]}

Cating, Emma E. M. ^{[1
]}

Cahoon, James F. ^{[1
]}

Papanikolas, John M. ^{[1
]}

机构：

[1] Univ N Carolina, Dept Chem, Chapel Hill, NC 27599 USA

来源：

ULTRAFAST PHENOMENA XIX | 2015年 / 162卷

关键词：

D O I：

10.1007/978-3-319-13242-6_165

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Femtosecond pump-probe microscopy is used to directly visualize the diffusion of photogenerated charge carriers in undoped silicon nanowires, as well as charge separation in a nanowire encoded with an axial p-type/intrinsic/n-type (p-i-n) junction.

引用

页码：671 / 674

页数：4

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