Visualization of Charge Carrier Motion in Semiconductor Nanowires with Ultrafast Pump-Probe Microscopy

被引:0
|
作者
Gabriel, Michelle M. [1 ]
Grumstrup, Erik M. [1 ]
Kirschbrown, Justin R. [1 ]
Pinion, Christopher W. [1 ]
Christesen, Joseph D. [1 ]
Zigler, David F. [1 ]
Cating, Emma E. M. [1 ]
Cahoon, James F. [1 ]
Papanikolas, John M. [1 ]
机构
[1] Univ N Carolina, Dept Chem, Chapel Hill, NC 27599 USA
来源
ULTRAFAST PHENOMENA XIX | 2015年 / 162卷
关键词
D O I
10.1007/978-3-319-13242-6_165
中图分类号
O59 [应用物理学];
学科分类号
摘要
Femtosecond pump-probe microscopy is used to directly visualize the diffusion of photogenerated charge carriers in undoped silicon nanowires, as well as charge separation in a nanowire encoded with an axial p-type/intrinsic/n-type (p-i-n) junction.
引用
收藏
页码:671 / 674
页数:4
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