Microspectroscopy and spectromicroscopy with photoemission electron microscopy using a new kind of imaging energy filter

被引：36
|
作者：
Merkel, M
Escher, M
Settemeyer, J
Funnemann, D
Oelsner, A
Ziethen, C
Schmidt, O
Klais, M
Schönhense, G
机构：
[1] FOCUS GMBH, D-65510 Hunstetten Gorsroth, Germany
[2] OMICRON GMBH, D-65232 Taunusstein, Germany
[3] Univ Mainz, D-55099 Mainz, Germany
来源：
SURFACE SCIENCE | 2001年 / 480卷 / 03期
关键词：
electron microscopy; photoelectron spectroscopy;
D O I：
10.1016/S0039-6028(01)00835-4
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
The use of an imaging retarding field analyser attached to the FOCUS IS-PEEM is described. This kind of energy filter is a simple, powerful tool to obtain microspectra from areas of down to about 1 mum using (V)UV and X-ray excitation sources. First results of microspectroscopy measured by excitation with a laboratory as well as a synchrotron X-ray source are presented. (C) 2001 Elsevier Science B.V. All rights reserved.
引用
收藏
页码：196 / 202
页数：7
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