Structural evolution of epitaxial SrRuO3 thin films grown on SrTiO3(001)

被引：20

作者：

Kim, SS ^{[1
]}

Kang, TS

Je, JH

机构：

[1] Sunchon Natl Univ, Dept Mat Sci & Met Engn, Sunchon 540742, South Korea

[2] Pohang Univ Sci & Technol, Dept Mat Sci & Engn, Pohang 790784, South Korea

来源：

JOURNAL OF APPLIED PHYSICS | 2001年 / 90卷 / 09期

关键词：

D O I：

10.1063/1.1405135

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Microstructural changes in epitaxial SrRuO3 thin films grown on SrTiO3(001) during the early stages of growth by pulsed laser deposition were studied using synchrotron x ray scattering. We find that at a very early stage of growth (less than or equal to 110 Angstrom), the film is composed of a single (110) domain only, in sharp contrast to double (110) domains reported previously for thick (greater than or equal to 1000 Angstrom) films. As the film grows further (> 110 Angstrom), another, 90 degrees rotated, (110) domain starts to form, coexisting with the original (110) domain. This domain evolution is attributed to strain relaxation, eventually resulting in significant atomic ordering in the in-plane direction. (C) 2001 American Institute of Physics.

引用

页码：4407 / 4410

页数：4

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