Three-dimensional crystalline Si film growth by the Ni silicide mediation

被引:19
作者
Kim, Joondong [1 ]
Han, Chang-Soo [1 ]
Park, Yun Chang [2 ]
Anderson, Wayne A. [3 ]
机构
[1] KIMM, Nanomech Syst Res Ctr, Taejon 305343, South Korea
[2] Natl Nanofab Ctr, Measurement & Anal Div, Taejon 305343, South Korea
[3] SUNY Buffalo, Dept Elect Engn, Buffalo, NY 14260 USA
关键词
D O I
10.1063/1.2828202
中图分类号
O59 [应用物理学];
学科分类号
摘要
Three-dimensional crystalline Si films were grown by the Ni silicide mediation. The metal-induced growth method, which is a spontaneous reaction of metal and silicon, forms a silicide layer first then induces the crystalline Si growth. By controlling the reaction between Ni and Si, the silicide formation was modulated. The NiSi2 migration crystallizes a Si film behind and mediates crystalline Si above it. The mechanism of silicide-mediated three-dimensional Si crystallization and the thin Si film Schottky photodiode are presented. (C) 2008 American Institute of Physics.
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页数:3
相关论文
共 14 条
[1]   Interference microscopy for nanometric surface microstructure analysis in excimer laser processing of silicon for flat panel displays [J].
Benatmane, A ;
Montgomery, PC ;
Fogarassy, E ;
Zahorski, D .
APPLIED SURFACE SCIENCE, 2003, 208 :189-193
[2]   In-situ investigation of the formation of nickel silicides during interaction of single-crystalline and amorphous silicon with nickel [J].
Bokhonov, B ;
Korchagin, M .
JOURNAL OF ALLOYS AND COMPOUNDS, 2001, 319 (1-2) :187-195
[3]   Formation of stacked Ni silicide nanocrystals for nonvolatile memory application [J].
Chen, Wei-Ren ;
Chang, Ting-Chang ;
Liu, Po-Tsun ;
Lin, Po-Sun ;
Tu, Chun-Hao ;
Chang, Chun-Yen .
APPLIED PHYSICS LETTERS, 2007, 90 (11)
[4]   Polycrystalline silicon prepared by metal induced crystallization [J].
Choi, JH ;
Kim, DY ;
Kim, SS ;
Park, SJ ;
Jang, J .
THIN SOLID FILMS, 2003, 440 (1-2) :1-4
[5]   Dielectrophoretically controlled fabrication of single-crystal nickel silicide nanowire interconnects [J].
Dong, LF ;
Bush, J ;
Chirayos, V ;
Solanki, R ;
Jiao, J ;
Ono, Y ;
Conley, JF ;
Ulrich, BD .
NANO LETTERS, 2005, 5 (10) :2112-2115
[6]   SILICIDE FORMATION AND SILICIDE-MEDIATED CRYSTALLIZATION OF NICKEL-IMPLANTED AMORPHOUS-SILICON THIN-FILMS [J].
HAYZELDEN, C ;
BATSTONE, JL .
JOURNAL OF APPLIED PHYSICS, 1993, 73 (12) :8279-8289
[7]   Self-assembled nanobridge formation and spontaneous growth of metal-induced nanowires [J].
Kim, J ;
Anderson, WA ;
Song, YJ ;
Kim, GB .
APPLIED PHYSICS LETTERS, 2005, 86 (25) :1-3
[8]  
KIM J, 2007, APPL PHYS LETT, V80
[9]   Direct electrical measurement of the self-assembled nickel silicide nanowire [J].
Kim, Joondong ;
Anderson, Wayne A. .
NANO LETTERS, 2006, 6 (07) :1356-1359
[10]   Direct evidence of linewidth effect:: Ni31Si12 and Ni3Si formation on 25 nm Ni fully silicided gates [J].
Kittl, J. A. ;
Lauwers, A. ;
Demeurisse, C. ;
Vrancken, C. ;
Kubicek, S. ;
Absil, P. ;
Biesemans, S. .
APPLIED PHYSICS LETTERS, 2007, 90 (17)