Multifrequency Near Field Scanning Optical Microscopy (MF-SNOM)

被引：0

作者：

Greener, H. ^{[1
]}

Mrejen, M. ^{[1
]}

Arieli, U. ^{[1
]}

Suchowski, H. ^{[1
]}

机构：

[1] Tel Aviv Univ, Sch Phys & Astron, IL-69978 Tel Aviv, Israel

来源：

2018 CONFERENCE ON LASERS AND ELECTRO-OPTICS (CLEO) | 2018年

关键词：

ATOMIC-FORCE MICROSCOPY;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

We introduce a novel excitation and detection scheme in near-field optical microscopy based on a multifrequency method. Using this method, we experimentally demonstrate enhanced sensitivity, implying improved spatial resolution in optical measurements.

引用

页数：2

共 6 条

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