共 10 条
The effect of electrolyte layer thickness on electrochemical migration of tin
被引:31
作者:

Zhong, Xiankang
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机构:
Southwest Petr Univ, Sch Oil & Nat Gas Engn, State Key Lab Oil & Gas Reservoir Geol & Exploita, Chengdu 610500, Peoples R China Southwest Petr Univ, Sch Oil & Nat Gas Engn, State Key Lab Oil & Gas Reservoir Geol & Exploita, Chengdu 610500, Peoples R China

Zhang, Guoan
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h-index: 0
机构:
Huazhong Univ Sci & Technol, Sch Chem & Chem Engn, Key Lab Large Format Battery Mat & Syst, Minist Educ, Wuhan 430074, Peoples R China Southwest Petr Univ, Sch Oil & Nat Gas Engn, State Key Lab Oil & Gas Reservoir Geol & Exploita, Chengdu 610500, Peoples R China

Guo, Xingpeng
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h-index: 0
机构:
Huazhong Univ Sci & Technol, Sch Chem & Chem Engn, Key Lab Large Format Battery Mat & Syst, Minist Educ, Wuhan 430074, Peoples R China Southwest Petr Univ, Sch Oil & Nat Gas Engn, State Key Lab Oil & Gas Reservoir Geol & Exploita, Chengdu 610500, Peoples R China
机构:
[1] Southwest Petr Univ, Sch Oil & Nat Gas Engn, State Key Lab Oil & Gas Reservoir Geol & Exploita, Chengdu 610500, Peoples R China
[2] Huazhong Univ Sci & Technol, Sch Chem & Chem Engn, Key Lab Large Format Battery Mat & Syst, Minist Educ, Wuhan 430074, Peoples R China
来源:
基金:
中国国家自然科学基金;
关键词:
Tin;
Anodic dissolution;
CHLORIDE;
CORROSION;
D O I:
10.1016/j.corsci.2015.04.014
中图分类号:
T [工业技术];
学科分类号:
08 ;
摘要:
In this work, electrochemical migration behaviour of tin under electrolyte layers with different thicknesses was investigated using thin electrolyte layer method. The results show that the time to short circuit first increases and then decreases with increasing thickness of the electrolyte layer, the maximum value is present at 100 mu m. Inductively Coupled Plasma Source Mass Spectrometer was employed to measure the local concentration of tin ions. The result shows that the lowest local concentration of tin ions is present at the 100-mu m-thick electrolyte layer, resulting in a maximum value in the time to short circuit. (C) 2015 Elsevier Ltd. All rights reserved.
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页数:5
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共 10 条
[1]
TUTORIAL - ELECTROLYTIC MODELS FOR METALLIC ELECTROMIGRATION FAILURE MECHANISMS
[J].
KRUMBEIN, SJ
.
IEEE TRANSACTIONS ON RELIABILITY,
1995, 44 (04)
:539-549

KRUMBEIN, SJ
论文数: 0 引用数: 0
h-index: 0
机构: AMP Incorporated, Harrisburg
[2]
Effect of the composition of Sn-Pb alloys on the microstructure of filaments and the electrochemical migration characteristics
[J].
Lee, Shin-Bok
;
Lee, Ho-Young
;
Jung, Min-Suk
;
Park, Young-Bae
;
Joo, Young-Chang
.
METALS AND MATERIALS INTERNATIONAL,
2011, 17 (04)
:617-621

Lee, Shin-Bok
论文数: 0 引用数: 0
h-index: 0
机构:
Seoul Natl Univ, Dept Mat Sci & Engn, Seoul 151742, South Korea Seoul Natl Univ, Dept Mat Sci & Engn, Seoul 151742, South Korea

Lee, Ho-Young
论文数: 0 引用数: 0
h-index: 0
机构:
Seoul Natl Univ, Dept Mat Sci & Engn, Seoul 151742, South Korea Seoul Natl Univ, Dept Mat Sci & Engn, Seoul 151742, South Korea

Jung, Min-Suk
论文数: 0 引用数: 0
h-index: 0
机构:
Seoul Natl Univ, Dept Mat Sci & Engn, Seoul 151742, South Korea Seoul Natl Univ, Dept Mat Sci & Engn, Seoul 151742, South Korea

Park, Young-Bae
论文数: 0 引用数: 0
h-index: 0
机构:
Andong Natl Univ, Sch Mat Sci & Engn, Andong 760749, South Korea Seoul Natl Univ, Dept Mat Sci & Engn, Seoul 151742, South Korea

Joo, Young-Chang
论文数: 0 引用数: 0
h-index: 0
机构:
Seoul Natl Univ, Dept Mat Sci & Engn, Seoul 151742, South Korea Seoul Natl Univ, Dept Mat Sci & Engn, Seoul 151742, South Korea
[3]
Microstructure and elemental composition of electrochemically formed dendrites on lead-free micro-alloyed low Ag solder alloys used in electronics
[J].
Medgyes, Balint
;
Horvath, Barbara
;
Illes, Balazs
;
Shinohara, Tadashi
;
Tahara, Akira
;
Harsanyi, Gabor
;
Krammer, Oliver
.
CORROSION SCIENCE,
2015, 92
:43-47

Medgyes, Balint
论文数: 0 引用数: 0
h-index: 0
机构:
Budapest Univ Technol & Econ, Dept Elect Technol, H-1111 Budapest, Hungary Budapest Univ Technol & Econ, Dept Elect Technol, H-1111 Budapest, Hungary

Horvath, Barbara
论文数: 0 引用数: 0
h-index: 0
机构:
Natl Inst Mat Sci, Mat Corros Grp, Tsukuba, Ibaraki 3050047, Japan Budapest Univ Technol & Econ, Dept Elect Technol, H-1111 Budapest, Hungary

Illes, Balazs
论文数: 0 引用数: 0
h-index: 0
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Budapest Univ Technol & Econ, Dept Elect Technol, H-1111 Budapest, Hungary Budapest Univ Technol & Econ, Dept Elect Technol, H-1111 Budapest, Hungary

Shinohara, Tadashi
论文数: 0 引用数: 0
h-index: 0
机构:
Natl Inst Mat Sci, Mat Corros Grp, Tsukuba, Ibaraki 3050047, Japan Budapest Univ Technol & Econ, Dept Elect Technol, H-1111 Budapest, Hungary

Tahara, Akira
论文数: 0 引用数: 0
h-index: 0
机构:
Natl Inst Mat Sci, Mat Corros Grp, Tsukuba, Ibaraki 3050047, Japan Budapest Univ Technol & Econ, Dept Elect Technol, H-1111 Budapest, Hungary

Harsanyi, Gabor
论文数: 0 引用数: 0
h-index: 0
机构:
Budapest Univ Technol & Econ, Dept Elect Technol, H-1111 Budapest, Hungary Budapest Univ Technol & Econ, Dept Elect Technol, H-1111 Budapest, Hungary

Krammer, Oliver
论文数: 0 引用数: 0
h-index: 0
机构:
Budapest Univ Technol & Econ, Dept Elect Technol, H-1111 Budapest, Hungary Budapest Univ Technol & Econ, Dept Elect Technol, H-1111 Budapest, Hungary
[4]
Electrochemical migration behaviour of Cu, Sn, Ag and Sn63/Pb37
[J].
Medgyes, Balint
;
Illes, Balazs
;
Harsanyi, Gabor
.
JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS,
2012, 23 (02)
:551-556

Medgyes, Balint
论文数: 0 引用数: 0
h-index: 0
机构:
Budapest Univ Technol & Econ, Dept Elect Technol, Budapest, Hungary Budapest Univ Technol & Econ, Dept Elect Technol, Budapest, Hungary

Illes, Balazs
论文数: 0 引用数: 0
h-index: 0
机构:
Budapest Univ Technol & Econ, Dept Elect Technol, Budapest, Hungary Budapest Univ Technol & Econ, Dept Elect Technol, Budapest, Hungary

Harsanyi, Gabor
论文数: 0 引用数: 0
h-index: 0
机构:
Budapest Univ Technol & Econ, Dept Elect Technol, Budapest, Hungary Budapest Univ Technol & Econ, Dept Elect Technol, Budapest, Hungary
[5]
On the electrochemical migration mechanism of tin in electronics
[J].
Minzari, Daniel
;
Jellesen, Morten S.
;
Moller, Per
;
Ambat, Rajan
.
CORROSION SCIENCE,
2011, 53 (10)
:3366-3379

Minzari, Daniel
论文数: 0 引用数: 0
h-index: 0
机构:
Tech Univ Denmark, Dept Mech Engn, DK-2800 Lyngby, Denmark Tech Univ Denmark, Dept Mech Engn, DK-2800 Lyngby, Denmark

Jellesen, Morten S.
论文数: 0 引用数: 0
h-index: 0
机构:
Tech Univ Denmark, Dept Mech Engn, DK-2800 Lyngby, Denmark Tech Univ Denmark, Dept Mech Engn, DK-2800 Lyngby, Denmark

Moller, Per
论文数: 0 引用数: 0
h-index: 0
机构:
Tech Univ Denmark, Dept Mech Engn, DK-2800 Lyngby, Denmark Tech Univ Denmark, Dept Mech Engn, DK-2800 Lyngby, Denmark

Ambat, Rajan
论文数: 0 引用数: 0
h-index: 0
机构:
Tech Univ Denmark, Dept Mech Engn, DK-2800 Lyngby, Denmark Tech Univ Denmark, Dept Mech Engn, DK-2800 Lyngby, Denmark
[6]
Electrochemical migration of tin in electronics and microstructure of the dendrites
[J].
Minzari, Daniel
;
Grumsen, Flemming Bjerg
;
Jellesen, Morten S.
;
Moller, Per
;
Ambat, Rajan
.
CORROSION SCIENCE,
2011, 53 (05)
:1659-1669

Minzari, Daniel
论文数: 0 引用数: 0
h-index: 0
机构:
Tech Univ Denmark, Dept Mech Engn, Sect Mat & Surface Technol, DK-2800 Lyngby, Denmark Tech Univ Denmark, Dept Mech Engn, Sect Mat & Surface Technol, DK-2800 Lyngby, Denmark

Grumsen, Flemming Bjerg
论文数: 0 引用数: 0
h-index: 0
机构:
Tech Univ Denmark, Dept Mech Engn, Sect Mat & Surface Technol, DK-2800 Lyngby, Denmark Tech Univ Denmark, Dept Mech Engn, Sect Mat & Surface Technol, DK-2800 Lyngby, Denmark

Jellesen, Morten S.
论文数: 0 引用数: 0
h-index: 0
机构:
Tech Univ Denmark, Dept Mech Engn, Sect Mat & Surface Technol, DK-2800 Lyngby, Denmark Tech Univ Denmark, Dept Mech Engn, Sect Mat & Surface Technol, DK-2800 Lyngby, Denmark

Moller, Per
论文数: 0 引用数: 0
h-index: 0
机构:
Tech Univ Denmark, Dept Mech Engn, Sect Mat & Surface Technol, DK-2800 Lyngby, Denmark Tech Univ Denmark, Dept Mech Engn, Sect Mat & Surface Technol, DK-2800 Lyngby, Denmark

Ambat, Rajan
论文数: 0 引用数: 0
h-index: 0
机构:
Tech Univ Denmark, Dept Mech Engn, Sect Mat & Surface Technol, DK-2800 Lyngby, Denmark Tech Univ Denmark, Dept Mech Engn, Sect Mat & Surface Technol, DK-2800 Lyngby, Denmark
[7]
Influence of electrolyte layer thickness and pH on the initial stage of the atmospheric corrosion of iron
[J].
Nishikata, A
;
Ichihara, Y
;
Hayashi, Y
;
Tsuru, T
.
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1997, 144 (04)
:1244-1252

论文数: 引用数:
h-index:
机构:

Ichihara, Y
论文数: 0 引用数: 0
h-index: 0
机构: Dept. of Metallurgical Engineering, Tokyo Institute of Technology, Meguro-ku, Tokyo, 2-12-1, O-okayama

Hayashi, Y
论文数: 0 引用数: 0
h-index: 0
机构: Dept. of Metallurgical Engineering, Tokyo Institute of Technology, Meguro-ku, Tokyo, 2-12-1, O-okayama

Tsuru, T
论文数: 0 引用数: 0
h-index: 0
机构: Dept. of Metallurgical Engineering, Tokyo Institute of Technology, Meguro-ku, Tokyo, 2-12-1, O-okayama
[8]
Electrochemical migration of tin in thin electrolyte layer containing chloride ions
[J].
Zhong, Xiankang
;
Zhang, Guoan
;
Qiu, Yubing
;
Chen, Zhenyu
;
Guo, Xingpeng
.
CORROSION SCIENCE,
2013, 74
:71-82

Zhong, Xiankang
论文数: 0 引用数: 0
h-index: 0
机构:
Huazhong Univ Sci & Technol, Hubei Key Lab Mat Chem & Serv Failure, Sch Chem & Chem Engn, Wuhan 430074, Peoples R China Huazhong Univ Sci & Technol, Hubei Key Lab Mat Chem & Serv Failure, Sch Chem & Chem Engn, Wuhan 430074, Peoples R China

Zhang, Guoan
论文数: 0 引用数: 0
h-index: 0
机构:
Huazhong Univ Sci & Technol, Hubei Key Lab Mat Chem & Serv Failure, Sch Chem & Chem Engn, Wuhan 430074, Peoples R China Huazhong Univ Sci & Technol, Hubei Key Lab Mat Chem & Serv Failure, Sch Chem & Chem Engn, Wuhan 430074, Peoples R China

Qiu, Yubing
论文数: 0 引用数: 0
h-index: 0
机构:
Huazhong Univ Sci & Technol, Hubei Key Lab Mat Chem & Serv Failure, Sch Chem & Chem Engn, Wuhan 430074, Peoples R China Huazhong Univ Sci & Technol, Hubei Key Lab Mat Chem & Serv Failure, Sch Chem & Chem Engn, Wuhan 430074, Peoples R China

Chen, Zhenyu
论文数: 0 引用数: 0
h-index: 0
机构:
Huazhong Univ Sci & Technol, Hubei Key Lab Mat Chem & Serv Failure, Sch Chem & Chem Engn, Wuhan 430074, Peoples R China Huazhong Univ Sci & Technol, Hubei Key Lab Mat Chem & Serv Failure, Sch Chem & Chem Engn, Wuhan 430074, Peoples R China

Guo, Xingpeng
论文数: 0 引用数: 0
h-index: 0
机构:
Huazhong Univ Sci & Technol, Hubei Key Lab Mat Chem & Serv Failure, Sch Chem & Chem Engn, Wuhan 430074, Peoples R China Huazhong Univ Sci & Technol, Hubei Key Lab Mat Chem & Serv Failure, Sch Chem & Chem Engn, Wuhan 430074, Peoples R China
[9]
In situ study the dependence of electrochemical migration of tin on chloride
[J].
Zhong, Xiankang
;
Zhang, Guoan
;
Qiu, Yubin
;
Chen, Zhenyu
;
Zou, Wenxin
;
Guo, Xingpeng
.
ELECTROCHEMISTRY COMMUNICATIONS,
2013, 27
:63-68

Zhong, Xiankang
论文数: 0 引用数: 0
h-index: 0
机构:
Huazhong Univ Sci & Technol, Sch Chem & Chem Engn, Hubei Key Lab Mat Chem & Serv Failure, Wuhan 430074, Peoples R China Huazhong Univ Sci & Technol, Sch Chem & Chem Engn, Hubei Key Lab Mat Chem & Serv Failure, Wuhan 430074, Peoples R China

Zhang, Guoan
论文数: 0 引用数: 0
h-index: 0
机构:
Huazhong Univ Sci & Technol, Sch Chem & Chem Engn, Hubei Key Lab Mat Chem & Serv Failure, Wuhan 430074, Peoples R China Huazhong Univ Sci & Technol, Sch Chem & Chem Engn, Hubei Key Lab Mat Chem & Serv Failure, Wuhan 430074, Peoples R China

Qiu, Yubin
论文数: 0 引用数: 0
h-index: 0
机构:
Huazhong Univ Sci & Technol, Sch Chem & Chem Engn, Hubei Key Lab Mat Chem & Serv Failure, Wuhan 430074, Peoples R China Huazhong Univ Sci & Technol, Sch Chem & Chem Engn, Hubei Key Lab Mat Chem & Serv Failure, Wuhan 430074, Peoples R China

Chen, Zhenyu
论文数: 0 引用数: 0
h-index: 0
机构:
Huazhong Univ Sci & Technol, Sch Chem & Chem Engn, Hubei Key Lab Mat Chem & Serv Failure, Wuhan 430074, Peoples R China Huazhong Univ Sci & Technol, Sch Chem & Chem Engn, Hubei Key Lab Mat Chem & Serv Failure, Wuhan 430074, Peoples R China

Zou, Wenxin
论文数: 0 引用数: 0
h-index: 0
机构:
Huazhong Univ Sci & Technol, Sch Chem & Chem Engn, Hubei Key Lab Mat Chem & Serv Failure, Wuhan 430074, Peoples R China Huazhong Univ Sci & Technol, Sch Chem & Chem Engn, Hubei Key Lab Mat Chem & Serv Failure, Wuhan 430074, Peoples R China

Guo, Xingpeng
论文数: 0 引用数: 0
h-index: 0
机构:
Huazhong Univ Sci & Technol, Sch Chem & Chem Engn, Hubei Key Lab Mat Chem & Serv Failure, Wuhan 430074, Peoples R China Huazhong Univ Sci & Technol, Sch Chem & Chem Engn, Hubei Key Lab Mat Chem & Serv Failure, Wuhan 430074, Peoples R China
[10]
The corrosion of tin under thin electrolyte layers containing chloride
[J].
Zhong, Xiankang
;
Zhang, Guoan
;
Qiu, Yubin
;
Chen, Zhenyu
;
Guo, Xingpeng
;
Fu, Chaoyang
.
CORROSION SCIENCE,
2013, 66
:14-25

Zhong, Xiankang
论文数: 0 引用数: 0
h-index: 0
机构:
Huazhong Univ Sci & Technol, Sch Chem & Chem Engn, Hubei Key Lab Mat Chem & Serv Failure, Wuhan 430074, Peoples R China Huazhong Univ Sci & Technol, Sch Chem & Chem Engn, Hubei Key Lab Mat Chem & Serv Failure, Wuhan 430074, Peoples R China

Zhang, Guoan
论文数: 0 引用数: 0
h-index: 0
机构:
Huazhong Univ Sci & Technol, Sch Chem & Chem Engn, Hubei Key Lab Mat Chem & Serv Failure, Wuhan 430074, Peoples R China Huazhong Univ Sci & Technol, Sch Chem & Chem Engn, Hubei Key Lab Mat Chem & Serv Failure, Wuhan 430074, Peoples R China

Qiu, Yubin
论文数: 0 引用数: 0
h-index: 0
机构:
Huazhong Univ Sci & Technol, Sch Chem & Chem Engn, Hubei Key Lab Mat Chem & Serv Failure, Wuhan 430074, Peoples R China Huazhong Univ Sci & Technol, Sch Chem & Chem Engn, Hubei Key Lab Mat Chem & Serv Failure, Wuhan 430074, Peoples R China

Chen, Zhenyu
论文数: 0 引用数: 0
h-index: 0
机构:
Huazhong Univ Sci & Technol, Sch Chem & Chem Engn, Hubei Key Lab Mat Chem & Serv Failure, Wuhan 430074, Peoples R China Huazhong Univ Sci & Technol, Sch Chem & Chem Engn, Hubei Key Lab Mat Chem & Serv Failure, Wuhan 430074, Peoples R China

Guo, Xingpeng
论文数: 0 引用数: 0
h-index: 0
机构:
Huazhong Univ Sci & Technol, Sch Chem & Chem Engn, Hubei Key Lab Mat Chem & Serv Failure, Wuhan 430074, Peoples R China Huazhong Univ Sci & Technol, Sch Chem & Chem Engn, Hubei Key Lab Mat Chem & Serv Failure, Wuhan 430074, Peoples R China

Fu, Chaoyang
论文数: 0 引用数: 0
h-index: 0
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Huazhong Univ Sci & Technol, Sch Chem & Chem Engn, Hubei Key Lab Mat Chem & Serv Failure, Wuhan 430074, Peoples R China Huazhong Univ Sci & Technol, Sch Chem & Chem Engn, Hubei Key Lab Mat Chem & Serv Failure, Wuhan 430074, Peoples R China