Characterization of Precipitated Phase in Cu-Ni-Si Alloy by Small-Angle X-ray Scattering, Small Angle Neutron Scattering and Atom Probe Tomography*1

被引：1

作者：

Sasaki, Hirokazu ^{[1
]}

Akiya, Shunta ^{[2
]}

Oba, Yojiro ^{[3
]}

Onuma, Masato ^{[4
]}

Giddings, A. D. ^{[5
]}

Ohkubo, Tadakatsu ^{[6
]}

机构：

[1] Furukawa Elect Corp Ltd, Anal Technol Ctr, Yokohama 2200073, Japan

[2] Furukawa Elect Corp Ltd, Automot Prod & Elect Labs, Nikko 3211493, Japan

[3] Japan Atom Energy Agcy, Mat Sci Res Ctr, Naka, Ibaraki 3191184, Japan

[4] Hokkaido Univ, Fac Engn, Appl Quantum Sci & Engn, Sapporo 0608628, Japan

[5] Ametek Co Ltd, CAMECA Business Unit, Tokyo 1050012, Japan

[6] Natl Inst Mat Sci, Res Ctr Magnet & Spintron Mat, Tsukuba 3050047, Japan

来源：

MATERIALS TRANSACTIONS | 2021年 / 63卷 / 10期

关键词：

transmission electron microscopy; small-angle X-ray scattering; small-angle neutron scattering; atom probe tomography; Cu-Ni-Si alloy; BEHAVIOR;

D O I：

10.2320/matertrans.MT-D2022003

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The strength of Cu-Ni-Si alloy can be improved by finely dispersing a Ni-Si-based compound as a precipitate into the Cu parent phase by heat treatment. In order to investigate the strengthening effect of the precipitate, quantitative evaluation of the size distribution and dispersion state is necessary. In this work, we utilized transmission electron microscopy, small-angle X-ray scattering, small-angle neutron scattering, and atom probe tomography to analyze this Ni-Si precipitated phase. The small-angle X-ray and neutron scattering results showed that the precipitated phase gradually became coarser as the aging temperature increased. The atom probe tomography and small-angle scattering provided complementary measurements of the diffusion layer at the interface between the Cu parent phase and the precipitated phase.

引用

页码：1384 / 1389

页数：6

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