Stabilization of a tungsten ⟨310⟩ cold field emitter

被引:30
作者
Kasuya, Keigo [1 ]
Katagiri, Souichi [1 ]
Ohshima, Takashi [1 ]
Kokubo, Shigeru [2 ]
机构
[1] Hitachi Ltd, Cent Res Lab, Tokyo 1858601, Japan
[2] Hitachi High Technol Corp, Hitachinaka, Ibaraki 3128504, Japan
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 2010年 / 28卷 / 05期
关键词
crystal structure; field emission; magnetic anisotropy; scanning electron microscopy; stability; tungsten; EMISSION CURRENT INSTABILITY; ELECTRON-GUN; HYDROGEN; ADSORPTION; SURFACE; CATHODE; TIP;
D O I
10.1116/1.3488988
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Cold-field-emission current from a tungsten < 310 > emitter in a scanning electron microscope (SEM) gun, evacuated by an ion pump and a supplementary nonevaporative getter pump, was stabilized. It was verified that the probe current from a local (310) crystal plane exhibits different time variations in comparison to that of total current. As for the probe current under a pressure of 2x10(-9) Pa, a stable plateau region-which lasted about 4 h-appeared just after flashing of the emitter. By observing emission patterns, it was verified that these different emission characteristics are originated from the anisotropy of current decay in accordance with crystal planes. With low-temperature "mild flashings" at 700 degrees C, the plateau region was extended to 12 h, which is long enough for practical SEM application. The superior properties of the plateau region, namely, high current, low noise, and small current variation, will enhance the performance and usability of electron microscopes. (C) 2010 American Vacuum Society. [DOI: 10.1116/1.3488988]
引用
收藏
页码:L55 / L60
页数:6
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