Levelized Low Cost Delay Test Compaction Considering IR-Drop Induced Power Supply Noise

被引：0

作者：

Jiang, Zhongwei ^{[1
]}

Wang, Zheng ^{[1
]}

Wang, Jing ^{[2
]}

Walker, D. M. H. ^{[1
]}

机构：

[1] Texas A&M Univ, Dept Comp Sci & Engn, College Stn, TX 77843 USA

[2] Adv Micro Devices Inc, Austin, TX USA

来源：

2011 IEEE 29TH VLSI TEST SYMPOSIUM (VTS) | 2011年

基金：

美国国家科学基金会;

关键词：

delay test; power supply noise; static; compaction; dynamic compaction; IR drop; GENERATION;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Power supply noise is very important in delay testing. Excessive noise can cause circuit delay increases that lead to test overkill. Test patterns that are too quiet can lead to test escapes. In this work, we introduce a realistic low cost delay test compaction flow that guardbands circuit delay during test using a sequence of estimation metrics. Significant reductions in CPU time are demonstrated over prior work.

引用

页码：52 / 57

页数：6

共 27 条

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