In situ characterization of phase transitions in cristobalite under high pressure by Raman spectroscopy and X-ray diffraction

被引:40
作者
Prokopenko, VB [1 ]
Dubrovinsky, LS
Dmitriev, V
Weber, HP
机构
[1] Uppsala Univ, Dept Earth Sci, S-75236 Uppsala, Sweden
[2] Swiss Norwegian Beam Line, SNBL ESRF, F-38043 Grenoble, France
关键词
inorganic materials; crystal structure; X-ray diffraction; high pressure; Raman spectroscopy;
D O I
10.1016/S0925-8388(01)01402-5
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
We have studied, in situ, the structure and optical properties of cristobalite under non-hydrostatic pressures of up to 61 GPa by means of micro-Raman spectroscopy and X-ray powder diffraction. The starting material. the (alpha -cristobalite phase of SiO2 (C-I), was formed after annealing of silica sol-gel glass at 1500 degreesC for 15 min. Mao-Bell and membrane-type diamond anvil cells were used for generation of the high pressure. On increasing the pressure, four polymorphs were found: C-I alpha -cristobalite up to 6 GPa. C-II in the pressure range 0.2-14 GPa, C-III from 14 to 35 GPa, and C-IV above 35 GPa, and no new phase was observed up to 61 GPa. The high-pressure phase C-IV is crystalline and quenchable. A monoclinically distorted alpha -PbO2-type structure provides the best fit to the X-ray powder pattern of the recovered phase C-IV. (C) 2001 Elsevier Science BY All rights reserved.
引用
收藏
页码:87 / 95
页数:9
相关论文
共 17 条
[1]  
BEALL GH, 1994, REV MINERAL, V29, P469
[2]  
Eremets M., 1996, HIGH PRESSURE EXPT M, P390
[3]   SHOCK AMORPHIZATION OF CRISTOBALITE [J].
GRATZ, AJ ;
DELOACH, LD ;
CLOUGH, TM ;
NELLIS, WJ .
SCIENCE, 1993, 259 (5095) :663-666
[4]   Formation of ultrafine particles of copper and copper sulfide in silica films and glasses prepared by sol-gel technique [J].
Gurin, VS ;
Prokopenko, VB ;
Melnichenko, IM ;
Poddenezhny, EN ;
Alexeenko, AA ;
Yumashev, KV .
JOURNAL OF NON-CRYSTALLINE SOLIDS, 1998, 232 :162-168
[5]   Transition to a crystalline high-pressure phase in a-GeO2 at room temperature [J].
Haines, J ;
Léger, JM ;
Chateau, C .
PHYSICAL REVIEW B, 2000, 61 (13) :8701-8706
[6]  
HALVERSONK, 1990, EOS T AM GEOPHYS UN, V71, P1671
[7]  
HAMMERSLEY A, 1996, ESRF98HAOIT
[8]  
HEMLEY RJ, 1994, REV MINERAL, V29, P41
[9]  
PALMER DC, 1994, AM MINERAL, V79, P1
[10]  
PALMER DC, 1994, PHYS CHEM MINER, V21, P481