Correlated Random Bit Generation Using Chaotic Semiconductor Lasers Under Unidirectional Optical Injection

被引:21
作者
Li, Xiao-Zhou [1 ]
Li, Song-Sui [1 ]
Chan, Sze-Chun [1 ,2 ]
机构
[1] City Univ Hong Kong, Dept Elect Engn, Hong Kong, Hong Kong, Peoples R China
[2] City Univ Hong Kong, State Key Lab Millimeter Waves, Hong Kong, Hong Kong, Peoples R China
来源
IEEE PHOTONICS JOURNAL | 2017年 / 9卷 / 05期
关键词
Semiconductor lasers; injection-locked lasers; random bit generation; chaos; SIGNAL INDUCED SYNCHRONIZATION; BANDWIDTH-ENHANCED CHAOS; TIME-DELAY-SIGNATURE; KEY DISTRIBUTION; FEEDBACK; ENCRYPTION; DYNAMICS; SYSTEM; LIGHT;
D O I
10.1109/JPHOT.2017.2748978
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Correlated random bit generation is investigated using three optically injected chaotic semiconductor lasers. Based on a rate-equation model, a continuous-wave injection first perturbs a common laser into chaos. The common laser then optically injects a pair of response lasers through a public channel unidirectionally. The two response lasers of identical parameters are synchronized. Their chaotic emissions are digitized in yielding correlated random bit streams. As the scheme advantageously involves no feedback loops, the output bits contain no undesirable time-delay information artifacts. Security is ensured as the response lasers produce bits that cannot be extracted using the information in the public channel alone. Output bit streams are generated at a tunable rate of up to about 2 Gbps with randomness verified by a test suite of the National Institute of Standards and Technology. The streams are correlated with a low bit error ratio of less than 4%, which is sensitive to parameter mismatch between the response lasers.
引用
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页数:11
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共 53 条
  • [41] Synchronization properties of three delay-coupled semiconductor lasers
    Vicente, Raul
    Fischer, Ingo
    Mirasso, Claudio R.
    [J]. PHYSICAL REVIEW E, 2008, 78 (06):
  • [42] Synchronization of polarization chaos from a free-running VCSEL
    Virte, Martin
    Sciamanna, Marc
    Panajotov, Krassimir
    [J]. OPTICS LETTERS, 2016, 41 (19) : 4492 - 4495
  • [43] Virte M, 2013, NAT PHOTONICS, V7, P60, DOI [10.1038/nphoton.2012.286, 10.1038/NPHOTON.2012.286]
  • [44] Enhancing the Bandwidth of the Optical Chaotic Signal Generated by a Semiconductor Laser With Optical Feedback
    Wang, Anbang
    Wang, Yuncai
    He, Hucheng
    [J]. IEEE PHOTONICS TECHNOLOGY LETTERS, 2008, 20 (17-20) : 1633 - 1635
  • [45] Thermally insensitive determination of the linewidth broadening factor in nanostructured semiconductor lasers using optical injection locking
    Wang, Cheng
    Schires, Kevin
    Osinski, Marek
    Poole, Philip J.
    Grillot, Frederic
    [J]. SCIENTIFIC REPORTS, 2016, 6
  • [46] Current Crowding Phenomenon: Theoretical and Direct Correlation With the Efficiency Droop of Light Emitting Diodes by a Modified ABC Model
    Wang, Liancheng
    Zhang, Zi-Hui
    Wang, Ning
    [J]. IEEE JOURNAL OF QUANTUM ELECTRONICS, 2015, 51 (05) : 1 - 9
  • [47] Simulation of Bidirectional Long-Distance Chaos Communication Performance in a Novel Fiber-Optic Chaos Synchronization System
    Wu, Jia-Gui
    Wu, Zheng-Mao
    Liu, Yu-Ran
    Fan, Li
    Tang, Xi
    Xia, Guang-Qiong
    [J]. JOURNAL OF LIGHTWAVE TECHNOLOGY, 2013, 31 (03) : 461 - 467
  • [48] Isochronous Synchronization Between Chaotic Semiconductor Lasers Over 40-km Fiber Links
    Wu, Jia-Gui
    Wu, Zheng-Mao
    Xia, Guang-Qiong
    Deng, Tao
    Lin, Xiao-Dong
    Tang, Xi
    Feng, Guo-Ying
    [J]. IEEE PHOTONICS TECHNOLOGY LETTERS, 2011, 23 (24) : 1854 - 1856
  • [49] Secure Key Distribution Based on Dynamic Chaos Synchronization of Cascaded Semiconductor Laser Systems
    Xue, Chenpeng
    Jiang, Ning
    Lv, Yunxin
    Qiu, Kun
    [J]. IEEE TRANSACTIONS ON COMMUNICATIONS, 2017, 65 (01) : 312 - 319
  • [50] Key distribution based on synchronization in bandwidth-enhanced random bit generators with dynamic post-processing
    Xue, Chenpeng
    Jiang, Ning
    Qiu, Kun
    Lv, Yunxin
    [J]. OPTICS EXPRESS, 2015, 23 (11): : 14510 - 14519