Superposition model for dielectric charging of RF MEMS capacitive switches under bipolar control-voltage waveforms

被引:41
|
作者
Peng, Zhen [1 ]
Yuan, Xiaobin [2 ]
Hwang, James C. M. [1 ]
Forehand, David I. [3 ]
Goldsmith, Charles L.
机构
[1] Lehigh Univ, Dept Elect & Comp Engn, Bethlehem, PA 18015 USA
[2] IBM Corp, Semicond Res & Dev Ctr, Hopewell Jct, NY 12533 USA
[3] MEMtronics Corp, Plano, TX 75075 USA
关键词
charge injection; dielectric films; dielectric materials; microelectromechanical devices; switches;
D O I
10.1109/TMTT.2007.909475
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Bipolar control-voltage waveforms, under which the control voltage alternates between positive and negative after each cycle, have been proposed to mitigate dielectric charging in electrostatically actuated RF microelectromechanical system capacitive switches. In this study, dielectric charging under bipolar waveforms is modeled and characterized quantitatively. In general, the experimental results agree with predictions based on the superposition of unipolar charging models that are extracted under positive and negative voltages, respectively. The basic assumptions for such a superposition model are examined in detail and validated experimentally. The current analysis indicates that, while bipolar waveforms can reduce charging, it is difficult to fine tune the waveforms to completely eliminate charging.
引用
收藏
页码:2911 / 2918
页数:8
相关论文
共 50 条
  • [1] Dielectric charging of RF MEMS capacitive switches under bipolar control-voltage waveforms
    Peng, Zhen
    Yuan, Xiaobin
    Hwang, James C. M.
    Forehand, David I.
    Goldsmith, Charles L.
    2007 IEEE/MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM DIGEST, VOLS 1-6, 2007, : 1809 - +
  • [2] Time and voltage dependence of dielectric charging in RF MEMS capacitive switches
    Herfst, R. W.
    Steeneken, P. G.
    Schmitz, J.
    2007 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM PROCEEDINGS - 45TH ANNUAL, 2007, : 417 - +
  • [3] A Compact Model For Dielectric Charging in RF MEMS Capacitive Switches
    Sumant, Prasad S.
    Aluru, Narayana R.
    Cangellaris, Andreas C.
    INTERNATIONAL JOURNAL OF RF AND MICROWAVE COMPUTER-AIDED ENGINEERING, 2009, 19 (02) : 197 - 203
  • [4] Characterization of dielectric charging in RF MEMS capacitive switches
    Herfst, R. W.
    Huizing, H. G. A.
    Steeneken, P. G.
    Schmitz, J.
    ICMTS 2006: PROCEEDINGS OF THE 2006 INTERNATIONAL CONFERENCE ON MICROELECTRONIC TEST STRUCTURES, 2006, : 133 - +
  • [5] Modeling of dielectric charging in RF MEMS capacitive switches
    Sumant, Prasad S.
    CangellariS, Andreas C.
    Aluru, Narayana R.
    MICROWAVE AND OPTICAL TECHNOLOGY LETTERS, 2007, 49 (12) : 3188 - 3192
  • [6] Acceleration of dielectric charging in RF MEMS capacitive switches
    Yuan, Xiaobin
    Peng, Zhen
    Hwang, James C. M.
    Forehand, David
    Goldsmith, Charles L.
    IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, 2006, 6 (04) : 556 - 563
  • [7] On the Modeling of Dielectric Charging in RF-MEMS Capacitive Switches
    Papaioannou, George
    Coccetti, Fabio
    Plana, Robert
    2010 TOPICAL MEETING ON SILICON MONOLITHIC INTEGRATED CIRCUITS IN RF SYSTEMS, 2010, : 108 - 111
  • [8] Impact of Humidity on Dielectric Charging in RF MEMS Capacitive Switches
    Peng, Zhen
    Palego, Cristiano
    Hwang, James C. M.
    Forehand, David I.
    Goldsmith, Charles L.
    Moody, Cody
    Malczewski, Andrew
    Pillans, Brandon W.
    Daigler, Richard
    Papapolymerou, John
    IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS, 2009, 19 (05) : 299 - 301
  • [9] Dielectric charging mechanisms in RF-MEMS capacitive switches
    Papaioannou, George J.
    Papapolymerou, John
    2007 EUROPEAN MICROWAVE CONFERENCE, VOLS 1-4, 2007, : 1157 - +
  • [10] Effect of Packaging on Dielectric Charging in RF MEMS Capacitive Switches
    Peng, Zhen
    Palego, Cristiano
    Hwang, James C. M.
    Moody, Cody
    Malczewski, Andrew
    Pillans, Brandon W.
    Forehand, David I.
    Goldsmith, Charles L.
    2009 IEEE/MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM, VOLS 1-3, 2009, : 1637 - +