Molecular thin film structure and multiple surface plasmon excitations at nano-interfaces in the attenuated total reflection Kretschmann configuration

被引：5

作者：

Kaneko, F

Saito, W

Sato, T

Hatakeyama, H

Shinbo, K

Kato, K

Wakamatsu, T

机构：

[1] Niigata Univ, Dept Elect & Elect Engn, Niigata 9502181, Japan

[2] Ibaraki Natl Coll Technol, Dept Elect Engn, Hitachinaka 3128508, Japan

来源：

THIN SOLID FILMS | 2003年 / 438卷

关键词：

surface plasmon excitation; attenuated total reflection; Kretschmann configuration; molecular thin film;

D O I：

10.1016/S0040-6090(03)00783-1

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Relationships between molecular thin film structure and multiple surface plasmon (SP) excitations at nano-interfaces have been investigated for prism/metal thin film/molecular thin films in the attenuated total reflection Kretschmann configuration. Recently, emission light through the prism that strongly depended upon the emission angles was observed using the reverse irradiation, that is, direct irradiation of a laser beam from air to molecular thin films. Emission light in the reverse irradiation has investigated in detail for organic thin films with various structures. From the dispersion property of the emission spectra at various emission angles, it was estimated that the emission light was caused by excitation of multiple SPs at the nano-interfaces. The emission properties also depended upon the amount of dye molecules, nano-spacing between the metal and dyes, and polarizations of the laser beam. It is thought that the phenomenon is useful for application to new devices utilizing multiple SP excitations. (C) 2003 Elsevier Science B.V. All rights reserved.

引用

页码：108 / 113

页数：6

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