An Experimental and Theoretical Investigation of Dynamic Pull-In in MEMS Resonators Actuated Electrostatically

被引:103
作者
Alsaleem, Fadi M. [1 ]
Younis, Mohammad I. [2 ]
Ruzziconi, Laura [2 ]
机构
[1] Microstaq Inc, Austin, TX 78744 USA
[2] SUNY Binghamton, Dept Mech Engn, Binghamton, NY 13902 USA
基金
美国国家科学基金会;
关键词
Dynamic pull-in; electrostatic force; escape phenomenon; microelectromechanical systems (MEMS); nonlinear dynamics; resonators; NONLINEAR DYNAMICS; ESCAPE; SIMULATION; OSCILLATOR; INTEGRITY; CHAOS;
D O I
10.1109/JMEMS.2010.2047846
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We present experimental and theoretical investigations of dynamic pull-in of electrostatically actuated resonators. Several experimental data are presented, showing regimes of ac forcing amplitude versus ac frequency, where a resonator is forced to pull in if operated within these regimes. Results are shown for primary and secondary resonance excitations. The influences of the initial conditions of the system, the ac excitation amplitude, the ac frequency, the excitation type, and the sweeping type are investigated. A shooting technique to find periodic motions and a basin-of-attraction analysis are used to predict the limits of the pull-in bands. When compared with the experimental data, the results have shown that the pull-in limits coincide with 30%-40% erosion lines of the safe basin in the case of primary resonance and 5%-15% erosion lines of the safe basin in the case of subharmonic resonance. Bifurcation diagrams have been constructed, which designers can use to establish factors of safety to reliably operate microelectromechanical-systems resonators away from pull-in bands and the danger of pull-in, depending on the expected disturbances and noise in the systems. [2009-0036]
引用
收藏
页码:794 / 806
页数:13
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