Phonon-assisted tunneling in direct-bandgap semiconductors

被引:5
作者
Mohammed, Mazharuddin [1 ,2 ]
Verhulst, Anne S. [1 ]
Verreck, Devin [1 ]
Van de Put, Maarten L. [3 ]
Magnus, Wim [1 ,4 ]
Soree, Bart [1 ,2 ,4 ]
Groeseneken, Guido [1 ,2 ]
机构
[1] Imec, Kapeldreef 75, B-3001 Leuven, Belgium
[2] Katholieke Univ Leuven, Dept Elect Engn, B-3001 Leuven, Belgium
[3] Univ Texas Dallas, Dept Mat Sci & Engn, Dallas, TX 75080 USA
[4] Univ Antwerp, Dept Phys, B-2020 Antwerp, Belgium
关键词
FIELD; TRANSISTORS; SCATTERING; SIMULATION; MODEL;
D O I
10.1063/1.5044256
中图分类号
O59 [应用物理学];
学科分类号
摘要
In tunnel field-effect transistors, trap-assisted tunneling (TAT) is one of the probable causes for degraded subthreshold swing. The accurate quantum-mechanical (QM) assessment of TAT currents also requires a QM treatment of phonon-assisted tunneling (PAT) currents. Therefore, we present a multi-band PAT current formalism within the framework of the quantum transmitting boundary method. An envelope function approximation is used to construct the electron-phonon coupling terms corresponding to local Frohlich-based phonon-assisted inter-band tunneling in direct-bandgap III-V semiconductors. The PAT current density is studied in up to 100 nm long and 20 nm wide p-n diodes with the 2- and 15-band material description of our formalism. We observe an inefficient electron-phonon coupling across the tunneling junction. We further demonstrate the dependence of PAT currents on the device length, for our non-self-consistent formalism which neglects changes in the electron distribution function caused by the electron-phonon coupling. Finally, we discuss the differences in doping dependence between direct band-to-band tunneling and PAT current. Published under license by AIP Publishing.
引用
收藏
页数:10
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