Behavioral Modeling of the Static Transfer Function of ADCs Using INL Measurements

被引：7

作者：

Guindi, Rafik S. ^{[1
]}

Saada, Ehal H. ^{[2
]}

机构：

[1] Nile Univ, Cairo, Egypt

[2] Mentor Graph Corp, Cairo, Egypt

来源：

2010 INTERNATIONAL CONFERENCE ON MICROELECTRONICS | 2010年

关键词：

D O I：

10.1109/ICM.2010.5696085

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

In this paper, we present a modeling approach for analog-to-digital converters (ADCs) based on modeling the static transfer function using integral nonlinearity (INL) measurements. The methodology relies on applying a Fast Fourier Transform (FFT) test to the output of a real ADC circuit and extracting the significant harmonics. These are used in a behavioral functional model to approximate the INL using a polynomial function. The resulting model is independent of the ADC type or structure, and is suitable for bottom-up system verification. We compare the performance of the new model with other models based on different modeling approaches, and show a gain in simulation speed of up to 300X.

引用

页码：108 / 111

页数：4