Thin films of nickel ferrite of thickness similar to 100 and 150 nm were deposited by pulsed laser deposition. The films were irradiated with a 200 MeV Ag15+ beam of three fluences 1 x 10(12), 2 x 10(12) and 4 x 10(12) ions/cm(2). X-ray diffraction showed a decrease in the intensity of peaks indicating progressive amorphisation with increased irradiation fluence. Fourier transform infra-red and Raman spectra of pristine and irradiated films were also recorded which showed a degradation of the crystallinity of the samples after irradiation. The damage cross section of the infra-red bands was determined. It was found that the two bands at 557 and 614 cm(-1) did not show similar behaviour with fluence. (C) 2010 Elsevier E.V. All rights reserved.