Compensation of static and transient thermal errors on CMMs

被引:19
作者
Kruth, JP [1 ]
Vanherck, R [1 ]
Van den Bergh, C [1 ]
机构
[1] Katholieke Univ Leuven, Dept Mech Engn, Div PMA, Louvain, Belgium
关键词
metrology; thermal deformation compensation; coordinate measuring machine;
D O I
10.1016/S0007-8506(07)62144-1
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Using CMMs under normal workshop conditions necessitates to take into account the influence of environmental temperature on the machine structure. Non-standardised environmental conditions result in temperature dependent measurement errors. The paper presents a parametric approach to describe the relation between transient temperature distributions and resulting deformation of the CMM. The focus lies on broadening the temperature range in which the original accuracy specifications can be guaranteed. Starting from a correction scheme for uniform, invariant temperature situations, an approach for transient environmental loads is developed. Based on a limited number of temperature inputs, the required correction coefficients for the probe position are calculated.
引用
收藏
页码:377 / 380
页数:4
相关论文
共 9 条
[1]  
Breyer K. H., 1991, PROGR PRECISION ENG, P56
[2]  
Bryan J., 1990, CIRP Annals - Manufacturing Technology, V39, P645, DOI [10.1016/S0007-8506(07)63001-7, DOI 10.1016/S0007-8506(07)63001-7, 10.1016/s0007-8506(07)63001-7]
[3]  
*GPS, ISOTC213WG3 GPS
[4]  
Kruth JP, 2000, PROCEEDINGS OF THE 33RD INTERNATIONAL MATADOR CONFERENCE, P223
[5]   TEMPERATURE PERTURBATION EFFECTS IN A HIGH-PRECISION CMM [J].
LINGARD, PS ;
PURSS, ME ;
SONA, CM ;
THWAITE, EG ;
MARIASSON, GH .
PRECISION ENGINEERING-JOURNAL OF THE AMERICAN SOCIETY FOR PRECISION ENGINEERING, 1991, 13 (01) :41-51
[6]  
SARTORI S, 1995, ANN CIRP, V44, P599
[7]  
Schellekens P, 1998, CIRP ANNALS 1998 - MANUFACTURING TECHNOLOGY, VOL 47/2/1998, P557
[8]  
Weck M., 1995, ANN CIRP, V44, P589, DOI DOI 10.1016/S0007-8506(07)60506-X
[9]  
Yang Q.D., 1999, EUR J MECH ENV ENG, V44, P146