The charge carrier distribution in dual-gate field-effect transistors is investigated as a function of semiconductor thickness. A good agreement with 2-dimensional numerically calculated transfer curves is obtained. For semiconductor thicknesses larger than the accumulation width, two spatially separated channels are formed. The cross-over from accumulation into depletion of the two channels in combination with a carrier density dependent mobility causes a shoulder in the transfer characteristics. A semiconducting monolayer has only a single channel. The charge carrier density, and consequently the mobility, are virtually constant and change monotonically with applied gate biases, leading to transfer curves without a shoulder. (C) 2012 American Institute of Physics. [doi: 10.1063/1.3677676]
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Holst Ctr TNO, NL-5605 KN Eindhoven, NetherlandsUniv London Imperial Coll Sci Technol & Med, Dept Phys, London SW7 2AZ, England
Gelinck, Gerwin
;
Heremans, Paul
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IMEC, B-3001 Louvain, Belgium
Katholieke Univ Leuven, Dept Elect Engn, B-3001 Louvain, BelgiumUniv London Imperial Coll Sci Technol & Med, Dept Phys, London SW7 2AZ, England
Heremans, Paul
;
Nomoto, Kazumasa
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Atsugi Tec, Sony Corp, Core Device Dev Grp, Display Device Dev Div, Atsugi, Kanagawa 2430021, JapanUniv London Imperial Coll Sci Technol & Med, Dept Phys, London SW7 2AZ, England
Nomoto, Kazumasa
;
Anthopoulos, Thomas D.
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Univ London Imperial Coll Sci Technol & Med, Dept Phys, London SW7 2AZ, EnglandUniv London Imperial Coll Sci Technol & Med, Dept Phys, London SW7 2AZ, England
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Elect & Telecommun Res Inst, IT Convergence & Components Lab, Taejon 305700, South KoreaElect & Telecommun Res Inst, IT Convergence & Components Lab, Taejon 305700, South Korea
Koo, Jae Bon
;
Ku, Chan Hoe
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机构:Elect & Telecommun Res Inst, IT Convergence & Components Lab, Taejon 305700, South Korea
Ku, Chan Hoe
;
Lim, Jung Wook
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机构:Elect & Telecommun Res Inst, IT Convergence & Components Lab, Taejon 305700, South Korea
Lim, Jung Wook
;
Kim, Seong Hyun
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机构:Elect & Telecommun Res Inst, IT Convergence & Components Lab, Taejon 305700, South Korea
机构:
Holst Ctr TNO, NL-5605 KN Eindhoven, NetherlandsUniv London Imperial Coll Sci Technol & Med, Dept Phys, London SW7 2AZ, England
Gelinck, Gerwin
;
Heremans, Paul
论文数: 0引用数: 0
h-index: 0
机构:
IMEC, B-3001 Louvain, Belgium
Katholieke Univ Leuven, Dept Elect Engn, B-3001 Louvain, BelgiumUniv London Imperial Coll Sci Technol & Med, Dept Phys, London SW7 2AZ, England
Heremans, Paul
;
Nomoto, Kazumasa
论文数: 0引用数: 0
h-index: 0
机构:
Atsugi Tec, Sony Corp, Core Device Dev Grp, Display Device Dev Div, Atsugi, Kanagawa 2430021, JapanUniv London Imperial Coll Sci Technol & Med, Dept Phys, London SW7 2AZ, England
Nomoto, Kazumasa
;
Anthopoulos, Thomas D.
论文数: 0引用数: 0
h-index: 0
机构:
Univ London Imperial Coll Sci Technol & Med, Dept Phys, London SW7 2AZ, EnglandUniv London Imperial Coll Sci Technol & Med, Dept Phys, London SW7 2AZ, England
机构:
Elect & Telecommun Res Inst, IT Convergence & Components Lab, Taejon 305700, South KoreaElect & Telecommun Res Inst, IT Convergence & Components Lab, Taejon 305700, South Korea
Koo, Jae Bon
;
Ku, Chan Hoe
论文数: 0引用数: 0
h-index: 0
机构:Elect & Telecommun Res Inst, IT Convergence & Components Lab, Taejon 305700, South Korea
Ku, Chan Hoe
;
Lim, Jung Wook
论文数: 0引用数: 0
h-index: 0
机构:Elect & Telecommun Res Inst, IT Convergence & Components Lab, Taejon 305700, South Korea
Lim, Jung Wook
;
Kim, Seong Hyun
论文数: 0引用数: 0
h-index: 0
机构:Elect & Telecommun Res Inst, IT Convergence & Components Lab, Taejon 305700, South Korea