Stress aging in the electron glass

被引：65

作者：

Orlyanchik, V ^{[1
]}

Ovadyahu, Z ^{[1
]}

机构：

[1] Hebrew Univ Jerusalem, Racah Inst Phys, IL-91904 Jerusalem, Israel

来源：

PHYSICAL REVIEW LETTERS | 2004年 / 92卷 / 06期

关键词：

D O I：

10.1103/PhysRevLett.92.066801

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

A new protocol for an aging experiment is studied in the electron-glass phase of indium-oxide films. In this protocol, the sample is exposed to a non-Ohmic electric field F for a waiting time t(w) during which the system attempts to reach a steady state (rather than relax towards equilibrium). The relaxation of the excess conductance DeltaG after Ohmic conditions are restored exhibits simple aging as long as F is not too large.

引用

页码：668011 / 668014

页数：4

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