Threefold electron scattering on graphite observed with C-60-adsorbed STM tips

被引:92
作者
Kelly, KF
Sarkar, D
Hale, GD
Oldenburg, SJ
Halas, NJ
机构
[1] RICE UNIV,RICE QUANTUM INST,DEPT ELECT & COMP ENGN,HOUSTON,TX 77251
[2] RICE UNIV,CTR NANOSCALE SCI & TECHNOL,HOUSTON,TX 77251
关键词
D O I
10.1126/science.273.5280.1371
中图分类号
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号
07 ; 0710 ; 09 ;
摘要
The scanning tunneling microscope (STM) has been used to observe threefold symmetric electron scattering from point defects on a graphite surface. These theoretically predicted electronic perturbations could not be observed with a bare metal tip but could only be imaged when a fullerene (C-60) molecule was adsorbed onto the tunneling region (apex) of an STM tip. Functionalizing an STM tip with an appropriate molecular adsorbate alters the density of states near the Fermi level of the tip and changes its imaging characteristics.
引用
收藏
页码:1371 / 1373
页数:3
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