On board electronic devices safety provided by DICE-based Muller C-elements

被引：6

作者：

Danilov, I. A. ^{[1
]}

Gorbunov, M. S. ^{[1
,2
]}

Shnaider, A. I. ^{[1
]}

Balbekov, A. O. ^{[1
]}

Rogatkin, Y. B. ^{[1
]}

Bobkov, S. G. ^{[1
,2
]}

机构：

[1] Russian Acad Sci, Sci Res Inst Syst Anal, Nakhimovsky Prosp 36-1, Moscow 117218, Russia

[2] Natl Res Nucl Univ, MEPhI Moscow Engn Phys Inst, Kashirskoe Shosse 31, Moscow 115409, Russia

来源：

ACTA ASTRONAUTICA | 2018年 / 150卷

关键词：

C-element; Soft error; Single event upset; Dual interlocked cell; Radiation hardening by design; Asynchronous circuits; RADIATION; DESIGN; CHARGE; QDI;

D O I：

10.1016/j.actaastro.2018.01.019

中图分类号：

V [航空、航天];

学科分类号：

08 ; 0825 ;

摘要：

Space radiation interacting with electronic components of on-board computing or navigation unit can bring to it's malfunction. Using error tolerant electronic components is a key factor ensuring safety of Space missions. The Muller C-element is one of the main part of the asynchronous circuits and also can be found in synchronous ones. Being sequential by its nature, it is vulnerable to single event upsets. We propose three CMOS circuit implementations of a soft error tolerant Muller C-element, whose tolerance is achieved by using of the well-known DICE-principle and is proved by SPICE simulations.

引用

页码：28 / 32

页数：5

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