Simultaneous multi-region background subtraction for core-level EEL spectra

被引：4
作者：
Held, Jacob T. [1 ]
Yun, Hwanhui [1 ]
Mkhoyan, K. Andre [1 ]
机构：
[1] Univ Minnesota, Dept Chem Engn & Mat Sci, 421 Washington Ave SE, Minneapolis, MN 55455 USA
来源：
ULTRAMICROSCOPY | 2020年 / 210卷
关键词：
EELS; STEM; Core-Level; Background; Fitting; IONIZATION CROSS-SECTIONS; K-SHELL; ELECTRON;
D O I：
10.1016/j.ultramic.2019.112919
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
We present a multi-region extension of power law background subtraction for core-level EEL spectra to improve the robustness of background removal. This method takes advantage of the post-edge shape of core-loss EEL edges to enable simultaneous fitting of pre- and post-edge background regions. This method also produces simultaneous and consistent background removal from multiple edges in a single EEL spectrum. The stability of this method with respect to the fitting energy window and the EELS signal to noise ratio is also discussed.
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页数：6
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