Structural properties of KxV2O5•nH2O nanocrystalline films

被引：3
作者：
Negm, Samia E. [1 ]
Mady, H. A. [1 ]
Moghny, A. S. Abdel [1 ]
Abd-Rabo, A. S. [1 ]
Bahgat, A. A. [1 ]
机构：
[1] Al Azhar Univ, Dept Phys, Fac Sci, Nasr City 11884, Cairo, Egypt
来源：
SOLID STATE SCIENCES | 2011年 / 13卷 / 03期
关键词：
Sol-gel; XRD; TEM; AFM; FTIR; DTA; VANADIUM PENTOXIDE GELS;
D O I：
10.1016/j.solidstatesciences.2010.12.031
中图分类号：
O61 [无机化学];
学科分类号：
070301 ; 081704 ;
摘要：
X-ray diffraction (XRD), transmission electron microscope (TEM), atomic force microscope (AFM), Fourier transform infrared (FIR) spectra and differential scanning calorimetry (DSC) were used to investigate the structure of KxV2O5 center dot nH(2)O xerogel films (with 0.0 <= x < 0.0091 mol). These films were produced by the sol-gel technique. XRD as well as TEM showed that KxV2O5 center dot nH(2)O thin films are highly oriented nanocrystals. The particle size as obtained is on the average 12 nm. AFM revealed that the grain shape of the present samples is a rod-like shape. DSC showed an endothermic peak with a minimum ranging between 102 degrees C and 172 degrees C due to the intercalation of K+ ions. (C) 2010 Elsevier Masson SAS. All rights reserved.
引用
收藏
页码：590 / 595
页数：6
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