High-level incorporation of antimony in germanium by laser annealing

被引:37
作者
Bruno, E. [1 ,2 ]
Scapellato, G. G. [1 ,2 ]
Bisognin, G. [3 ,4 ]
Carria, E. [1 ,2 ]
Romano, L. [1 ,2 ]
Carnera, A. [3 ,4 ]
Priolo, F. [1 ,2 ]
机构
[1] Univ Catania, MATIS IMM CNR, I-95123 Catania, Italy
[2] Univ Catania, Dipartimento Fis & Astron, I-95123 Catania, Italy
[3] Univ Padua, MATIS IMM CNR, I-35131 Padua, Italy
[4] Univ Padua, Dipartimento Fis, I-35131 Padua, Italy
关键词
X-RAY-DIFFRACTION; ION-IMPLANTATION; ON-INSULATOR; GE; SILICON; SEGREGATION; MOBILITY; DEVICES;
D O I
10.1063/1.3520671
中图分类号
O59 [应用物理学];
学科分类号
摘要
In this work we investigate pulse laser annealing as an alternative approach to reach high-level incorporation of Sb in substitutional location in crystalline germanium. Laser irradiation is demonstrated to recover also those structural defects, like honeycomb structures, that form during high-fluence heavy-ion implantations in Ge and that cannot be eliminated by conventional thermal treatments. Indeed, concentrations of substitutional Sb higher than 1 x 10(21) at./cm(3) have been obtained, well above the solid solubility of Sb in Ge. The strain induced on the Ge host lattice is also investigated, evidencing that the obtained Sb doped Ge layer is pseudomorphic to the Ge substrate while positively strained by the substitutional Sb atoms present within the Ge matrix. The kinetics of this Sb-rich Ge alloy phase is finally investigated, showing that most of Sb goes out of lattice with increasing the annealing temperature up to 488 degrees C, leading to a decrease in the related lattice deformation. These results are very relevant for the future high-mobility channel technology. c 2010 American Institute of Physics. [doi:10.1063/1.3520671]
引用
收藏
页数:6
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