Effect of carbon doping on GaN:Er

被引:11
作者
Overberg, M
Abernathy, CR
MacKenzie, JD
Pearton, SJ
Wilson, RG
Zavada, JM
机构
[1] Univ Florida, Dept Mat Sci & Engn, Gainesville, FL 32606 USA
[2] Univ Cambridge, Cambridge, England
[3] USA, European Res Off, London NW1 5TH, England
来源
MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY | 2001年 / 81卷 / 1-3期
关键词
GaN; erbium doping; carbon doping; annealing;
D O I
10.1016/S0921-5107(00)00686-3
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The effect of carbon doping on the photoluminescence (PL) and morphology of GaN:Er has been investigated. GaN:Er,C with [Er] similar to 8.5 x 10(20) cm(-3), was grown using elemental Ga, elemental Er and CBr4 via gas-source molecular beam epitaxy (GSMBE). The optimum room temperature 1.54 mum PL intensity was obtained for a carbon concentration of similar to 7.7 x 10(20) cm(-3). Further increase in the carbon concentration led to a decrease in overall PL intensity, but slightly decreased the degree of thermal quenching between 20 and 300 K. Comparison of thermal quenching data of GaN:Er grown with triethylgallium (TEG) and that grown with elemental Ga suggests that oxygen is more effective than carbon at suppressing thermal quenching. Material grown without high impurity backgrounds shows 75% quenching while that grown with TEG shows no quenching. Carbon-doped material falls in between these two values depending upon the amount of carbon in the film. Annealing improved the 300 K PL intensity from carbon-doped material and decreased the intensity from low impurity material. (C) 2001 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:121 / 126
页数:6
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