Sub-nanosecond single line-of-sight (SLOS) x-ray imagers (invited)

被引：44

作者：

Engelhorn, K. ^{[1
]}

Hilsabeck, T. J. ^{[1
]}

Kilkenny, J. ^{[1
]}

Morris, D. ^{[1
]}

Chung, T. M. ^{[2
]}

Dymoke-Bradshaw, A. ^{[3
]}

Hares, J. D. ^{[3
]}

Bell, P. ^{[4
]}

Bradley, D. ^{[4
]}

Carpenter, A. C. ^{[4
]}

Dayton, M. ^{[4
]}

Nagel, S. R. ^{[4
]}

Claus, L. ^{[5
]}

Porter, J. ^{[5
]}

Rochau, G. ^{[5
]}

Sanchez, M. ^{[5
]}

Ivancic, S. ^{[6
]}

Sorce, C. ^{[6
]}

Theobald, W. ^{[6
]}

机构：

[1] Gen Atom, San Diego, CA 92121 USA

[2] TMC2 Innovat LLC, Murrieta, CA 92563 USA

[3] Kentech Instruments Ltd, Wallingford OX10 8BD, Oxon, England

[4] Lawrence Livermore Natl Lab, Livermore, CA 94550 USA

[5] Sandia Natl Labs, POB 5800, Albuquerque, NM 87185 USA

[6] Lab Laser Energet, Rochester, NY 14623 USA

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 2018年 / 89卷 / 10期

关键词：

SECONDARY-ELECTRON EMISSION;

D O I：

10.1063/1.5039648

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

A new generation of fast-gated x-ray framing cameras have been developed that are capable of capturing multiple frames along a single line-of-sight with 30 ps temporal resolution. The instruments are constructed by integrating pulse-dilation electron imaging with burst mode hybrid-complimentary metal-oxide-semiconductor sensors. Two such instruments have been developed, characterized, and fielded at the National Ignition Facility and theOMEGAlaser. These instruments are particularly suited for advanced x-ray imaging applications in Inertial Confinement Fusion and High energy density experiments. Here, we discuss the system architecture and the techniques required for tuning the instruments to achieve optimal performance. Characterization results are also presented along with planned future improvements to the design. Published by AIP Publishing.

引用

页数：9

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