Controlling Reversible Dielectric Breakdown in Metal/Polymer Nanocomposites

被引：18

作者：

Kim, Jiwon ^{[1
]}

Grzybowski, Bartosz A. ^{[1
]}

机构：

[1] Northwestern Univ, Dept Chem, Dept Chem & Biol Engn, Evanston, IL 60208 USA

来源：

ADVANCED MATERIALS | 2012年 / 24卷 / 14期

关键词：

nanocomposites; metals; polymers; electrical breakdown; bistability; SOFT-BREAKDOWN; GATE OXIDES; THIN-FILMS; PERCOLATION; CONDUCTION; COMPLEXES; SILICON; STRESS;

D O I：

10.1002/adma.201104334

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

Composites comprising metal nanorods encased in a polymer matrix exhibit reversible electric breakdown and can be cycled between low- and high-conductance states multiple times without permanent damage to the material. The voltage at which the breakdown occurs can be adjusted by engineering the properties of the polymeric matrix, in particular by doping the polymer with dipole-possessing additives whose role is to screen the applied electric fields. Copyright © 2012 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.

引用

页码：1850 / 1855

页数：6

共 32 条

[11] DIELECTRIC-BREAKDOWN IN ELECTRICALLY STRESSED THIN-FILMS OF THERMAL SIO2 [J].

HARARI, E .

JOURNAL OF APPLIED PHYSICS, 1978, 49 (04) :2478-2489

[12] Soft breakdown in ultrathin gate oxides: Correlation with the percolation theory of nonlinear conductors [J].

Houssa, M ;

Nigam, T ;

Mertens, PW ;

Heyns, MM .

APPLIED PHYSICS LETTERS, 1998, 73 (04) :514-516

[13] A non-planar organic molecule with non-volatile electrical bistability for nano-scale data storage [J].

Hu, Junping ;

Li, Yingfeng ;

Ji, Zhuoyu ;

Jiang, Guiyuan ;

Yang, Lianming ;

Hu, Wenping ;

Gao, Hongjun ;

Jiang, Lei ;

Wen, Yongqiang ;

Song, Yanlin ;

Zhu, Daoben .

JOURNAL OF MATERIALS CHEMISTRY, 2007, 17 (33) :3530-3535

[14]

Ibbitson D.A., 1960, J. Am. Chem. Soc, V82, P5127

[15] DEVELOPMENT OF PULSED DIELECTRIC-BREAKDOWN IN LIQUIDS [J].

JONES, HM ;

KUNHARDT, EE .

JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1995, 28 (01) :178-188

[16] PERCOLATION AND CONDUCTION [J].

KIRKPATRICK, S .

REVIEWS OF MODERN PHYSICS, 1973, 45 (04) :574-588

[17]

Lee S, 2010, NAT NANOTECHNOL, V5, P412, DOI [10.1038/NNANO.2010.81, 10.1038/nnano.2010.81]

[18] Thickness dependent soft-breakdown phenomena of low dielectric constant thin films and corresponding activation energy [J].

Lee, SW ;

Kim, H ;

Shi, FG ;

Zhao, B .

MICROELECTRONICS JOURNAL, 2002, 33 (08) :605-608

[19] NANOMETRIC DIELECTRICS [J].

LEWIS, TJ .

IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION, 1994, 1 (05) :812-825

[20] Density functional theory characterisation of 4-hydroxyazobenzene [J].

Minisini, Benoit ;

Fayet, Guillaume ;

Tsobnang, Francois ;

Bardeau, Jean Francois .

JOURNAL OF MOLECULAR MODELING, 2007, 13 (12) :1227-1235

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