Experimental demonstration of wakefield effects in a THz planar diamond accelerating structure

被引：45

作者：

Antipov, S. ^{[1
,2
]}

Jing, C. ^{[1
,2
]}

Kanareykin, A. ^{[1
]}

Butler, J. E. ^{[1
]}

Yakimenko, V. ^{[3
]}

Fedurin, M. ^{[3
]}

Kusche, K. ^{[3
]}

Gai, W. ^{[2
]}

机构：

[1] Euclid Techlabs LLC, Solon, OH 44139 USA

[2] Argonne Natl Lab, Argonne Wakefield Accelerator Facil, Argonne, IL 60439 USA

[3] Brookhaven Natl Lab, Accelerator Test Facil, Upton, NY 11973 USA

来源：

APPLIED PHYSICS LETTERS | 2012年 / 100卷 / 13期

关键词：

D O I：

10.1063/1.3697640

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We have directly measured THz wakefields induced by a subpicosecond, intense relativistic electron bunch in a diamond loaded accelerating structure via the wakefield acceleration method. We present here the beam test results from the diamond based structure. Diamond has been chosen for its high breakdown threshold and unique thermoconductive properties. Fields produced by a leading (drive) beam were used to accelerate a trailing (witness) electron bunch, which followed the drive bunch at a variable distance. The energy gain of a witness bunch as a function of its separation from the drive bunch describes the time structure of the generated wakefield. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.3697640]

引用

页数：3

共 15 条

[11] Amplified coherent emission from electron beams prebunched in a masked chicane [J].

Nguyen, DC ;

Carlsten, BE .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1996, 375 (1-3) :597-601

[12]

Schoessow P, 2009, AIP CONF PROC, V1086, P404, DOI 10.1063/1.3080941

[13]

Ter Mikaelian M.L., 1972, High Energy Electromagnetic Processes in Condensed Media

[14] Breakdown limits on gigavolt-per-meter electron-beam-driven wakefields in dielectric structures [J].

Thompson, M. C. ;

Badakov, H. ;

Cook, A. M. ;

Rosenzweig, J. B. ;

Tikhoplav, R. ;

Travish, G. ;

Blumenfeld, I. ;

Hogan, M. J. ;

Ischebeck, R. ;

Kirby, N. ;

Siemann, R. ;

Walz, D. ;

Muggli, P. ;

Scott, A. ;

Yoder, R. B. .

PHYSICAL REVIEW LETTERS, 2008, 100 (21)

[15]

Xiao L., 2001, PHYS REV, VE 65, P016505

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