TEM characterization of a Cr/Ti/TiC graded interlayer for magnetron-sputtered TiC/a-C:H nanocomposite coatings

被引:56
作者
Galvan, D
Pei, YT
De Hosson, JTM
机构
[1] Univ Groningen, Ctr Mat Sci, Dept Appl Phys, NL-9747 AG Groningen, Netherlands
[2] Univ Groningen, Netherlands Inst Met Res, NL-9747 AG Groningen, Netherlands
关键词
interlayer; TENT; Cr/Ti; TiC; a-C : H; nanocomposite;
D O I
10.1016/j.actamat.2005.04.040
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
A TiC/a-C:H nanocomposite coating is deposited on top of a Cr/Ti/TiC graded interlayer. Cross-section transmission electron microscopy is employed to investigate the detailed structure of the interlayer and the coating. Five different phases are formed as a consequence of the compositional gradient within the interlayer: pure Cr, a solid solution of Ti in Cr, a Ti/Cr amorphous/nanocrystalline phase, alpha-Ti and TiC. Solid state amorphization occurs during the interlayer deposition to give a dispersion of TiCr beta-phase nanocrystals in an amorphous matrix. The TiC phase is textured and contains numerous stacking faults as a result of the growth in under-stoichiometric carbon concentration. C-enriched columnar boundaries are present within the coating, originating from the TiC column boundaries of the interlayer. The work indicates that an interlayer of amorphous/nanocrystalline Ti/Cr phase would reduce the presence of growth defects such as columnar boundaries within nanocomposite TiC/a-C:H coatings. (c) 2005 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.
引用
收藏
页码:3925 / 3934
页数:10
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