Consistent time-of-flight mobility measurements and polymer light-emitting diode current-voltage characteristics

被引：145
作者：
Campbell, IH
Smith, DL
Neef, CJ
Ferraris, JP
机构：
[1] Los Alamos Natl Lab, Los Alamos, NM 87545 USA
[2] Univ Texas, Richardson, TX 75083 USA
来源：
APPLIED PHYSICS LETTERS | 1999年 / 74卷 / 19期
关键词：
D O I：
10.1063/1.124021
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
We present time-of-flight mobility measurements and measured and calculated current-voltage (I-V) characteristics of structures fabricated using a soluble poly(p-phenylene vinylene) derivative. Time-of-flight measurements were used to determine the electric field dependent hole mobility. This mobility was then used, without adjustable parameters, to calculate the I-V characteristics of space-charge-limited, hole only devices. The measured and calculated I-V characteristics are in good agreement over five orders of magnitude in current. These results demonstrate that an electric field dependent mobility, without invoking trapping effects, provides an accurate description of hole transport in this polymer. (C) 1999 American Institute of Physics. [S0003-6951(99)00419-2].
引用
收藏
页码：2809 / 2811
页数：3
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