First microwave power performance of AlGaN/GaN HEMTs on SopSiC composite substrate

被引:10
作者
Hoel, V. [1 ]
Defrance, N. [1 ]
De Jaeger, J. C. [1 ]
Gerard, H. [1 ]
Gaquiere, C. [1 ]
Lahreche, H. [2 ]
Langer, R. [2 ]
Wilk, A. [2 ]
Lijadi, M. [2 ]
Delage, S. [3 ]
机构
[1] USTL, CNRS, IEMN, UMR 8520, F-59652 Villeneuve Dascq, France
[2] Picogiga Int, F-91971 Courtaboeuf 7, France
[3] ATL III V Lab, F-91461 Marcoussis, France
关键词
D O I
10.1049/el:20083258
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The first results obtained from AlGaN/GaN HEMT devices on MBE epitaxial structures grown on 'composite' substrates are presented. These substrates are based on innovative structures in which a thin Si single crystal layer is transferred on top of a thick polycrystalline SiC wafer. The fabrication of the transistors is based on a process. flow close to those used on epitaxy on Si bulk substrates. The results show the capabilities of such composite devices, providing HEMT devices for microwave power applications.
引用
收藏
页码:238 / 239
页数:2
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