Theoretical study of the atomic and electronic structure of grain boundaries in SiC

被引:3
|
作者
Kohyama, M [1 ]
Tanaka, K [1 ]
机构
[1] Natl Inst Adv Ind Sci & Technol, Special Div Green Life Technol, Interface Sci Res Grp, Ikeda, Osaka 5638577, Japan
来源
POLYCRYSTALLINE SEMICONDUCTORS VII, PROCEEDINGS | 2003年 / 93卷
关键词
electron microscopy; electronic structure; first-principles calculation; grain boundary; silicon carbide;
D O I
10.4028/www.scientific.net/SSP.93.387
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The atomic and electronic structure of a typical coincidence tilt boundary in cubic SiC, the {122}Sigma=9 boundary, has been examined theoretically using the first-principles calculations based on the density-functional theory. Results are compared with recent electron microscopy observations. We have obtained the stable configurations for the N-type polar, P-type polar and non-polar interfaces, which have different interface stoichiometries and different numbers of Si-Si or C-C wrong bonds. The relative stability among the interfaces has been analyzed by calculating the thermodynamic potentials as a function of the atomic chemical potentials. The relative stability of the zigzag model against the straight model for the nonpolar interface has been shown, which can well explain the high-resolution electron microscopy observation of the triple junction of the Sigma=9 and Sigma=3 boundaries. Effects of wrong bonds on the electronic structure have been analyzed through the electronic structures of the interfaces and antisite defects, which are consistent with electron energy-loss spectroscopy observations.
引用
收藏
页码:387 / 392
页数:6
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