Layout Decomposition for Spacer-is-Metal (SIM) Self-Aligned Double Patterning

被引:0
|
作者
Fang, Shao-Yun [1 ]
Tai, Yi-Shu [2 ]
Chang, Yao-Wen [2 ,3 ]
机构
[1] Natl Taiwan Univ Sci & Technol, Dept Elect Engn, Taipei 106, Taiwan
[2] Natl Taiwan Univ, Dept Elect Engn, Taipei 106, Taiwan
[3] Natl Taiwan Univ, Grad Inst Elect Engn, Taipei 106, Taiwan
来源
2015 20TH ASIA AND SOUTH PACIFIC DESIGN AUTOMATION CONFERENCE (ASP-DAC) | 2015年
关键词
LITHOGRAPHY;
D O I
暂无
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
Self-aligned double patterning (SADP) has become a preferred double patterning technology, due to its better overlay controllability. Two types of layout decomposition schemes are used to define two-dimensional layout patterns in SADP: Spacer-is-Metal (SIM) and Spacer-is-Dielectric (SID), and SIM-type layout decomposition typically has higher decomposition flexibility (especially for gridless designs). While SID-type layout decomposition has been studied extensively, however, only one previous work extended a satisfiability-based SID-type decomposer to SIM-type layout decomposition; this SAT-based method is inefficient for large-scale designs and not applicable to non-decomposable layouts. This paper introduces an efficient graph-based SIM-type layout decomposition heuristic. The decomposition problem is first transformed into a constrained set-covering problem. Then, an efficient algorithm composed of a greedy heuristic followed by a partition-based solution refinement scheme is proposed to simultaneously minimize the conflicts on both core masks and cut masks. Experimental results show that the algorithm can efficiently derive a good decomposition solution with minimized pattern conflicts.
引用
收藏
页码:671 / 676
页数:6
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