Layout-Based Evaluation of Read/Write Performance of SOT-MRAM and SOTFET-RAM

被引:0
作者
Afuye, Olalekan [1 ]
Agwa, Shady [1 ]
Batten, Christopher [1 ]
Apsel, Alyssa [1 ]
机构
[1] Cornell Univ, Sch Elect & Comp Engn, Ithaca, NY 14850 USA
来源
IEEE 51ST EUROPEAN SOLID-STATE DEVICE RESEARCH CONFERENCE (ESSDERC 2021) | 2021年
关键词
D O I
10.1109/ESSDERC53440.2021.9631814
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper presents a comparison of array-level performance of non-volatile SOT-MRAM and SOTFET-RAM to conventional 6T CMOS SRAM using a specially developed simulation suite that merges physics-based compact models and layout-based parasitic extraction. Unlike prior work, our characterization framework generates a full layout of the memory array including all peripheral logic and routing. The framework uses an industry-standard parasitic extraction tool to generate the full netlist including parasitics which is then simulated using compact models for the appropriate emerging non-volatile device. Using this framework, we show about 1.8 x energy savings for total read operations and write operations, and 2x area savings for the SOT-based memories relative to a comparable CMOS SRAM for a 256x128 array size. Our unique full-layout approach also enables important insights that challenge conventional wisdom based on higher-level modeling.
引用
收藏
页码:283 / 286
页数:4
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