High-Temperature Characterizations of a Half-Bridge Wire-Bondless SiC MOSFET Module

被引:19
作者
Chen, Yue [1 ]
Lei, Guangyin [2 ]
Lu, Guo-Quan [3 ]
Mei, Yun-Hui [4 ]
机构
[1] Tianjin Univ, Sch Mat Sci & Engn, Tianjin 300072, Peoples R China
[2] Fudan Univ, Acad Engn & Technol, Inst Future Lighting, Shanghai 200433, Peoples R China
[3] Virginia Tech, Bradley Dept Elect & Comp Engn, Ctr Power Elect Syst, Blacksburg, VA 24061 USA
[4] Tiangong Univ, Sch Elect & Elect Engn, Tianjin 300387, Peoples R China
基金
中国国家自然科学基金;
关键词
Silicon carbide; MOSFET; Inductance; Substrates; Temperature measurement; Switches; Cooling; Wire-bondless; SiC MOSFET; high-temperature;
D O I
10.1109/JEDS.2021.3119428
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
SiC MOSFET allows higher temperature capability with higher switching efficiency than that of conventional Si devices, due to its superior electrical and thermal properties. Nevertheless, there are few reports on the systematic characterization of the SiC MOSFET power module operating at high-temperature. In this paper, a SiC MOSFET power module with planar interconnection was designed and fabricated to achieve low parasitic inductance and improved thermal performance. The static and dynamic performance of the SiC power module were characterized at 200 degrees C. The thermal resistance of the double-sided cooling power module is 28.5% lower than that of the one with single-sided cooling.
引用
收藏
页码:966 / 971
页数:6
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