Magnetic force microscopy (MFM) belongs to the methods that enable spatially resolved magnetization measurements on common thin-film samples or magnetic nanostructures. The lateral resolution can be much higher than in Kerr microscopy, another spatially resolved magnetization imaging technique, but since MFM commonly necessitates positioning a cantilever tip typically within a few nanometers from the surface, it is often more complicated than other techniques. Here, we investigate the progresses in MFM on magnetic nanofibers that can be found in the literature during the last years. While MFM measurements on magnetic nanodots or thin-film samples can often be found in the scientific literature, reports on magnetic force microscopy on single nanofibers or chaotic nanofiber mats are scarce. The aim of this review is to show which MFM investigations can be conducted on magnetic nanofibers, where the recent borders are, and which ideas can be transferred from MFM on other rough surfaces towards nanofiber mats.
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Abelmann L, 2017, ENCYCLOPEDIA OF SPECTROSCOPY AND SPECTROMETRY, 3RD EDITION, VOL 2: G-M, P675, DOI 10.1016/B978-0-12-803224-4.00029-7
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CSIC CEI UAM CSIC, Inst Micro & Nanotecnol, IMN CNM, PTM, Isaac Newton 8, Tres Cantos 28760, SpainCSIC CEI UAM CSIC, Inst Micro & Nanotecnol, IMN CNM, PTM, Isaac Newton 8, Tres Cantos 28760, Spain
Alvarez-Sanchez, Ruben
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Miguel Garcia-Martin, Jose
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CSIC CEI UAM CSIC, Inst Micro & Nanotecnol, IMN CNM, PTM, Isaac Newton 8, Tres Cantos 28760, SpainCSIC CEI UAM CSIC, Inst Micro & Nanotecnol, IMN CNM, PTM, Isaac Newton 8, Tres Cantos 28760, Spain
Miguel Garcia-Martin, Jose
;
Briones, Fernando
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h-index: 0
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CSIC CEI UAM CSIC, Inst Micro & Nanotecnol, IMN CNM, PTM, Isaac Newton 8, Tres Cantos 28760, SpainCSIC CEI UAM CSIC, Inst Micro & Nanotecnol, IMN CNM, PTM, Isaac Newton 8, Tres Cantos 28760, Spain
Briones, Fernando
;
Luis Costa-Kramer, Jose
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h-index: 0
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CSIC CEI UAM CSIC, Inst Micro & Nanotecnol, IMN CNM, PTM, Isaac Newton 8, Tres Cantos 28760, SpainCSIC CEI UAM CSIC, Inst Micro & Nanotecnol, IMN CNM, PTM, Isaac Newton 8, Tres Cantos 28760, Spain
机构:
CSIC CEI UAM CSIC, Inst Micro & Nanotecnol, IMN CNM, PTM, Isaac Newton 8, Tres Cantos 28760, SpainCSIC CEI UAM CSIC, Inst Micro & Nanotecnol, IMN CNM, PTM, Isaac Newton 8, Tres Cantos 28760, Spain
Alvarez-Sanchez, Ruben
;
Miguel Garcia-Martin, Jose
论文数: 0引用数: 0
h-index: 0
机构:
CSIC CEI UAM CSIC, Inst Micro & Nanotecnol, IMN CNM, PTM, Isaac Newton 8, Tres Cantos 28760, SpainCSIC CEI UAM CSIC, Inst Micro & Nanotecnol, IMN CNM, PTM, Isaac Newton 8, Tres Cantos 28760, Spain
Miguel Garcia-Martin, Jose
;
Briones, Fernando
论文数: 0引用数: 0
h-index: 0
机构:
CSIC CEI UAM CSIC, Inst Micro & Nanotecnol, IMN CNM, PTM, Isaac Newton 8, Tres Cantos 28760, SpainCSIC CEI UAM CSIC, Inst Micro & Nanotecnol, IMN CNM, PTM, Isaac Newton 8, Tres Cantos 28760, Spain
Briones, Fernando
;
Luis Costa-Kramer, Jose
论文数: 0引用数: 0
h-index: 0
机构:
CSIC CEI UAM CSIC, Inst Micro & Nanotecnol, IMN CNM, PTM, Isaac Newton 8, Tres Cantos 28760, SpainCSIC CEI UAM CSIC, Inst Micro & Nanotecnol, IMN CNM, PTM, Isaac Newton 8, Tres Cantos 28760, Spain