Evolution of film orientation in Y2MnCrO6 epitaxial films prepared by a two-step growth method

被引：2
|
作者：
Hao, L. [1 ]
Zhang, Z. F. [1 ]
Yang, L. [1 ]
Xie, X. N. [1 ]
Yu, Q. X. [1 ]
Zhu, H. [1 ]
机构：
[1] Univ Sci & Technol China, Dept Phys, Hefei 230026, Anhui, Peoples R China
来源：
THIN SOLID FILMS | 2015年 / 580卷
基金：
中国国家自然科学基金;
关键词：
Y2MnCrO6; Epitaxial film; Two-step growth; Uniaxial anisotropy; MAGNETIC-PROPERTIES; THIN-FILMS; SINGLE-CRYSTAL; PEROVSKITE; MAGNETORESISTANCE; FERRIMAGNETISM; TEMPERATURE; DEPENDENCE; THICKNESS;
D O I：
10.1016/j.tsf.2015.03.025
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Epitaxial thin films of Y2MnCrO6 (YMCO) have been fabricated on various substrates via a two-step process combining magnetron sputtering technique and ex-situ annealing method. X-ray diffraction observations revealed that film orientation and quality are dominantly governed by the lattice mismatch between film and substrate. Moreover, orientation of the films grown on SrTiO3 can be tuned to some extent by adjusting substrate temperature and post-annealing process. The YMCO films were found to undergo a paramagnetic-ferrimagnetic transition at similar to 70 K, which is consistent with the bulk sample. Furthermore, the hysteresis loops indicate that the films may own a uniaxial anisotropy with the easy axis along the c-direction. (C) 2015 Elsevier B.V. All rights reserved.
引用
收藏
页码：94 / 100
页数：7
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