Statistical modeling of frequency responses using linear Bayesian vector fitting

被引：2

作者：

De Ridder, Simon ^{[1
]}

Deschrijver, Dirk ^{[1
]}

Spina, Domenico ^{[1
]}

Vande Ginste, Dries ^{[1
]}

Dhaene, Tom ^{[1
]}

机构：

[1] Univ Ghent, Dept Informat Technol, IDLab, IMEC, Ghent, Belgium

来源：

INTERNATIONAL JOURNAL OF NUMERICAL MODELLING-ELECTRONIC NETWORKS DEVICES AND FIELDS | 2020年 / 33卷 / 06期

关键词：

adaptive sampling; bayesian inference; macromodeling; RATIONAL APPROXIMATION; SAMPLING ALGORITHM; MULTIPORT SYSTEMS;

D O I：

10.1002/jnm.2762

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This article presents a Bayesian extension of the vector fitting (VF) procedure for rational approximation of frequency-domain responses. The proposed method treats the linear part of VF in a Bayesian way, while propagating distributions through the nonlinear part by sampling. As such, it is capable of providing data-driven uncertainty information along with the rational fit. The Bayesian VF technique is applied to two realistic design examples, a double folded stub filter and a RAM memory channel, demonstrating its validity and highlighting three potential applications of this novel framework.

引用

页数：17

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