The crystal structure and texture analyses of polycrystalline thin film sample using multiple diffraction datasets obtained by asymmetric diffraction technique

Data collection and data analysis procedures for the crystal structure and texture analyses of polycrystalline thin film sample are described. For data collection, the thin film diffractometer based on the parallel-beam optics should be used, Multiple diffraction datasets can be obtained with it in asymmetric 2 theta scan at various fixed incident angles. Each of these datasets exhibits the different degree of preferred orientaion effect. Multiple datastes are used to analyze both crystal structure and texture of polycrystalline thin film sample. An example of the application of present procedure to the structure analysis of Bi3FeO(12) thin film is given, The Rietveld method was used for the refinement of structure and texture parameters.